Results 21 to 30 of about 2,962,395 (163)

Quantitative phase-mode electrostatic force microscopy on silicon oxide nanostructures

, 2020
Phase-mode electrostatic force microscopy (EFM-Phase) is a viable technique to image surface electrostatic potential of silicon oxide stripes fabricated by oxidation scanning probe lithography, exhibiting an inhomogeneous distribution of localized ...
P. STOLIAR, Biscarini, F, R. V. MARTINEZ, Albonetti C., P. ANNIBALE, Chiodini, S, R. GARCIA, F. BISCARINI, Garcia, R, Martinez R. V., Stoliar, P, Garcia R., Albonetti, C, Martinez, R V, Chiodini S., Stoliar P., S. CHIODINI, Annibale, P, Annibale P., C. ALBONETTI, Biscarini F., Annibale, P; id_orcid   +21 more
core   +1 more source

Conductivity of macromolecular networks measured by electrostatic force microscopy [PDF]

, 2003
High-resolution electrostatic force microscopy (EFM)-phase measurements are reported on molecular networks of semiconductor polymer poly-hexylthiophene (P3HT) and DNA molecules.
C. H. Lei, Macdonald, JE, A. Das, Das, A, Elliott, Martin, Lei, CH, Das, Arindam, Elliott, M, Macdonald, John Emyr, M. Elliott, Lei, C. H., J. E. Macdonald   +11 more
core   +1 more source

Direct probing of semiconductor barium titanate via electrostatic force microscopy Sondagem direta de titanato de bário semicondutorpor meio de microscopia de força eletrostática

Cerâmica, 2007
Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias ...
S. M. Gheno, H. L. Hasegawa, P. I. Paulin Filho   +2 more
doaj   +1 more source

Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation

Nanomaterials, 2020
Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4H ...
Yinghui Wu, Dong Wang, Jinyuan Liu, Houzhi Cai, Yueqiang Zhang   +4 more
doaj   +1 more source

Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy [PDF]

, 2016
Lift-mode electrostatic force microscopy (EFM) is one of the most convenient imaging modes to study the local dielectric properties of non-planar samples. Here we present the quantitative analysis of this imaging mode.
Fumagalli, L.; id_orcid, Fabregas, R., Biagi, M. C., Gomila, G., Van Der Hofstadt, M.   +4 more
core   +2 more sources

Probing the dopant profile in nanoscale devices by low temperature electrostatic force microscopy

AIP Advances, 2019
Probing dopant distributions in nanoscale devices may find important applications in failure analysis. In this work, we employed cryogenic electrostatic force microscopy (EFM) to probe the dopant distribution in a lateral nanoscale bipolar junction ...
Wanqing Wang, Zhao Fan, Kaixiang Chen, Hao Wei, Yaping Dan   +4 more
doaj   +1 more source

Dielectric Imaging of Fixed HeLa Cells by In-Liquid Scanning Dielectric Force Volume Microscopy

Nanomaterials, 2021
Mapping the dielectric properties of cells with nanoscale spatial resolution can be an important tool in nanomedicine and nanotoxicity analysis, which can complement structural and mechanical nanoscale measurements. Recently we have shown that dielectric
Martí Checa, Ruben Millan-Solsona, Adrianna Glinkowska Mares, Silvia Pujals, Gabriel Gomila   +4 more
doaj   +1 more source

Interfacial electrostatic heterogeneity in water-processed natural rubber/MWCNT triboelectric nanogenerators [PDF]

RSC Applied Interfaces
Polymer-based triboelectric nanogenerators (TENGs) provide a useful platform for investigating interfacial charge organization in soft materials. However, the interfacial processes governing charge organization in elastomeric systems processed in aqueous
Fernanda V. Barasuol, Kelly S. Moreira, Fernando Galembeck, Aldo J. G. Zarbin, Thiago A. L. Burgo, Carolina Ferreira de Matos Jauris   +5 more
doaj   +1 more source

Capacitive Measurements of SiO₂ Films of Different Thicknesses Using a MOSFET-Based SPM Probe

Sensors, 2021
We utilized scanning probe microscopy (SPM) based on a metal-oxide-silicon field-effect transistor (MOSFET) to image interdigitated electrodes covered with oxide films that were several hundred nanometers in thickness.
Hoontaek Lee, Kumjae Shin, Wonkyu Moon
doaj   +1 more source

Ohmic-to-Schottky Modification of Zno-Metal Contact Modulated by Film Thickness [PDF]

Materials Research
This work investigated the charge transport behavior at the interface between a Pt-Ir metal contact and transparent zinc oxide (ZnO) electrodes with one, four, and eight ZnO layers.
Raquele Lima Moreira, Luis Paulo Mourão dos Santos, Francisco Carlos Carneiro Soares Salomão, Eduardo B. Barros, Igor Frota Vasconcelos   +4 more
doaj   +1 more source