Ultrahigh dielectric constant of thin films obtained by electrostatic force microscopy and artificial neural networks [PDF]
, 2012 Copyright 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.A detailed analysis of the electrostatic interaction between ...
E. Castellano-Hernández +2 more
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Electrostatic force microscopy analysis of Bi0.7Dy0.3FeO3 thin films prepared by pulsed laser deposition integrated with ZnO films for microelectromechanical systems and memory applications [PDF]
Modern Electronic Materials, 2018 In this paper, we report the charge trapping phenomena in zinc oxide (n-ZnO) and Bi0.7Dy0.3FeO3 (BDFO)/ZnO thin films deposited on p-type <100> conducting Si substrate.
Deepak Bhatia +4 more
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Beilstein Journal of Nanotechnology, 2019 Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems.
Aaron Mascaro +4 more
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Functional supramolecular tetrathiafulvalene-based films with mixed valences states [PDF]
, 2016 Tetrathiafulvalene molecules substituted with a carboxylic acid group (TTFCOOH) were bound as redox-active moieties into a poly(4-vinyl pyridine) (P4VP) skeleton through non-covalent interactions (hydrogen bonds). The aspect of the resulting P4VP-TTFCOOH
Amabilino, David B. +4 more
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Photoelectrical Properties Investigated on Individual Si Nanowires and Their Size Dependence
Nanoscale Research Letters, 2021 Periodically ordered arrays of vertically aligned Si nanowires (Si NWs) are successfully fabricated with controllable diameters and lengths. Their photoconductive properties are investigated by photoconductive atomic force microscopy (PCAFM) on ...
Xiaofeng Hu +3 more
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Charge Characterization Of An Electrically Charged Fiber Via Electrostatic Force Microscopy [PDF]
Journal of Engineered Fibers and Fabrics, 2006 The charge of a corona charged electret fiber as well as an uncharged glass fiber was characterized via Electrostatic Force Microscopy (EFM). Electrostatic force gradient images were obtained by monitoring the shifts in phase between the oscillations of ...
Juan P. Hinestroza +2 more
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Beilstein Journal of Nanotechnology, 2015 Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin +6 more
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Electrostatic Force Microscopy Measurement System for Micro-topography of Non-conductive Devices
Measurement Science Review, 2018 A home-made electrostatic force microscopy (EFM) system is described which is directed toward assessment of the microscopic geometry of the surface of specimens made of non-conductive material with a large thickness. This system is based on the variation
He Gaofa +3 more
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Creation of Optimal Frequency for Electrostatic Force Microscopy Using Direct Digital Synthesizer
Applied Sciences, 2017 Electrostatic force microscopy (EFM) is a useful technique when measuring the surface electric potential of a substrate regardless of its topography. Here, we have developed a frequency detection method for alternating current (AC) bias in EFM.
Seunghyun Moon +4 more
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Nanomaterials, 2020 Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4H ...
Yinghui Wu +4 more
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