Results 141 to 150 of about 2,263 (164)
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Observation of surface potential at nanometer scale by electrostatic force microscopy (EFM) with large signals

Materials Science and Engineering: B, 1998
Abstract By polarising the tip of an atomic force microscope (AFM) (in non-contact resonant mode) it is possible to detect local variations in the surface potential of nanostructures. These potential variations are detected by measuring the cantilever flexure produced by the applied signal. This information is obtained at the same time as the classic
G Leveque   +3 more
openaire   +1 more source

Atomic Force Microscopy-Based Force Spectroscopy and Multiparametric Imaging of Biomolecular and Cellular Systems

Chemical Reviews, 2021
Daniel J. Muller   +2 more
exaly  

Force spectroscopy of single cells using atomic force microscopy

Nature Reviews Methods Primers, 2021
Albertus Viljoen   +2 more
exaly  

Issues with implementing a high‐quality lung cancer screening program

Ca-A Cancer Journal for Clinicians, 2014
James L Mulshine
exaly  

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