Results 141 to 150 of about 2,962,395 (163)

The Effects of Chain Conformation and Nanostructure on the Dielectric Properties of Polymers. [PDF]

Materials (Basel)
Mogbojuri G, Abtahi S, Hendeniya N, Chang B.   +3 more
europepmc   +1 more source

Adsorption of Cationic Lignin Derivatives on Negatively Charged Model Surfaces and Hair Fibers: Implications for Hair Conditioning Performance. [PDF]

ACS Appl Mater Interfaces
Fernandes C, Cabaça D, Guzmán E, Serra R, Eivazi A, Norgren M, Alves L, Medronho B, Rasteiro MDG, Varela C.   +9 more
europepmc   +1 more source

From Nanoscale to Macroscale Characterization of Sulfur-Modified Oxidized Carbon Nanotubes in Styrene Butadiene Rubber Compounds. [PDF]

ACS Omega
Posadas P, Bernal-Ortega P, Bernal MM, Nogales A, Navarro R, Valentín JL.   +5 more
europepmc   +1 more source

Editorial for the Special Issue on MEMS/NEMS Devices and Applications, 3rd Edition. [PDF]

Micromachines (Basel)
Dai ZX, Ono T, Dai CL.
europepmc   +1 more source

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Observation of surface potential at nanometer scale by electrostatic force microscopy (EFM) with large signals

Materials Science and Engineering: B, 1998
Abstract By polarising the tip of an atomic force microscope (AFM) (in non-contact resonant mode) it is possible to detect local variations in the surface potential of nanostructures. These potential variations are detected by measuring the cantilever flexure produced by the applied signal. This information is obtained at the same time as the classic
G Leveque, J Bonnet, A Tahraoui, P Girard   +3 more
openaire   +3 more sources

Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)

Solid State Phenomena, 1998
openaire   +3 more sources

Dielectric Nanotomography Based on Electrostatic Force Microscopy: A Numerical Analysis [PDF]

Journal of Applied Physics, 2020
Electrostatic force microscopy (EFM) can image nanoscale objects buried below the surface. Here, we theoretically show that this capabilitycan be used to obtain nanotomographic information, i.e., the physical dimensions and dielectric properties, of ...
Gabriel Gomila, Rene Fabregas
exaly   +2 more sources

Mapping of Local Electrical Properties in Epitaxial Graphene Using Electrostatic Force Microscopy

Nano Letters, 2011
Local electrical characterization of epitaxial graphene grown on 4H-SiC (0001) using electrostatic force microscopy (EFM) in ambient conditions and at elevated temperatures is presented.
Timothy Burnett, Olga Kazakova, Rositza Yakimova   +2 more
exaly   +2 more sources

Nanoparticles Charge Response From Electrostatic Force Microscopy [PDF]

Applied Physics Letters, 2013
Electrostatic force microscopy (EFM) allows measurement of tiny changes in tip-sample capacitance. When nanoobjects are studied by EFM, they only contribute a very small fraction of the total capacitance between the tip and the sample.
Hervé Aubin, Jérôme Lesueur, Nicola Pinna   +2 more
exaly   +2 more sources

Electrostatic Force Microscopy and Potentiometry of Realistic Nanostructured Systems

Journal of Applied Physics, 2009
We investigate the dependency of electrostatic interaction forces on applied potentials in electrostatic force microscopy (EFM) as well as in related local potentiometry techniques such as Kelvin probe microscopy (KPM).
Daniele Prevosto, Pasqualantonio Pingue, Massimiliano Labardi   +2 more
exaly   +4 more sources