Results 141 to 150 of about 2,263 (164)
Some of the next articles are maybe not open access.
Materials Science and Engineering: B, 1998
Abstract By polarising the tip of an atomic force microscope (AFM) (in non-contact resonant mode) it is possible to detect local variations in the surface potential of nanostructures. These potential variations are detected by measuring the cantilever flexure produced by the applied signal. This information is obtained at the same time as the classic
G Leveque +3 more
openaire +1 more source
Abstract By polarising the tip of an atomic force microscope (AFM) (in non-contact resonant mode) it is possible to detect local variations in the surface potential of nanostructures. These potential variations are detected by measuring the cantilever flexure produced by the applied signal. This information is obtained at the same time as the classic
G Leveque +3 more
openaire +1 more source
Force spectroscopy of single cells using atomic force microscopy
Nature Reviews Methods Primers, 2021Albertus Viljoen +2 more
exaly
Issues with implementing a high‐quality lung cancer screening program
Ca-A Cancer Journal for Clinicians, 2014James L Mulshine
exaly

