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The environmental scanning electron microscope and its applications.
Scanning electron microscopy, 1983An environmental scanning electron microscope can be made by incorporating a pressure limiting aperture at some distance below the objective aperture of an SEM, and by providing independent pumping between these two apertures. Tilting of the pressure limiting aperture with respect to the axis of the electron optics column redirects the gas jet which ...
G D, Danilatos, R, Postle
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Experimental evaluation of environmental scanning electron microscopes at high chamber pressure
Journal of Microscopy, 2015SummaryIn environmental scanning electron microscopy (ESEM) high pressure applications have become increasingly important. Wet or biological samples can be investigated without time‐consuming sample preparation and potential artefacts from this preparation can be neglected.Unfortunately, the signal‐to‐noise ratio strongly decreases with increasing ...
H, Fitzek +4 more
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Single Evaluation of C. Elegans inside Environmental Scanning Electron Microscope
2008 International Symposium on Micro-NanoMechatronics and Human Science, 2008This paper presents the single evaluation of Caenorhabditis Elegans (C. Elegans) by the nanorobotic manipulation system inside an Environmental-Scanning Electron Microscope (E-SEM). C. Elegans has complex outer and inner structures constructed by approximately one thousand cells. Their fine structures were observed by E-SEM directly; without any drying
Masahiro Nakajima +4 more
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Dynamic Studies of Materials Using the Environmental Scanning Electron Microscope
MRS Proceedings, 1990AbstractDynamic studies allow the observation of microscopical changes of materials over time as various factors alter an object. Using this methodology, processes important in art conservation and archaeology such as the wetting and drying of consolidated and unconsolidated building materials or the corrosion of metals from air pollutants can be ...
Eric Doehne, Dusan Stulik
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1994
Scanning electron microscopy (SEM) has applied to microscopic characterization for decades. Traditional SEMs work under high-vacuum conditions. The secondary electron images of a specimen can reach a nanometer resolution if the specimen is well conducted electrically.
Junhui Li, Michael Pecht
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Scanning electron microscopy (SEM) has applied to microscopic characterization for decades. Traditional SEMs work under high-vacuum conditions. The secondary electron images of a specimen can reach a nanometer resolution if the specimen is well conducted electrically.
Junhui Li, Michael Pecht
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Environmental Scanning Electron Microscope with Electrohydraulic Fatigue Loading Stage
1997Abstract : This instrumentation is a unique combination of an Environmental Scanning Electron Microscope (ESEM) with an electrohydraulic fatigue loading stage. The ESEM uses a patented technology that provides direct image capability in an environmental chamber that can contain gas or water vapor and in which temperature and pressure (to 50 Ton) can be
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High pressure imaging in the environmental scanning electron microscope (ESEM)
2009We discuss advances in technology that allow high-quality secondary electron imaging at high pressures in the (E)SEM. The importance of this is the ability to observe hydrated specimens at realistic temperatures whilst maintaining a suitably high relative humidity.
D. J. Stokes +4 more
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