EPreNet: A Condition-Guided Network Accelerates Etching Profile Prediction. [PDF]
Lu M, Jin Z, Wang W, He J, Liu Q.
europepmc +1 more source
The Mechanism of Ruthenium Oxide Catalyzed Electroless Etching of Silicon in Oxidizing HF Solution. [PDF]
Bai B +6 more
europepmc +1 more source
Quantum confinement dominates band gaps while defects lead the photoluminescence in silicon nanowires. [PDF]
Diwan A +6 more
europepmc +1 more source
An Investigation into the Footing Profile Suppression in (110) Si Anisotropic Etching. [PDF]
Wang Z +8 more
europepmc +1 more source
Evolution of Fused Silica Subsurface Damage in Chemical Etching and Its Influence on Surface Loss. [PDF]
Zhang X +6 more
europepmc +1 more source
Advances in silicon carbide pressure sensors for high-temperature extreme environment sensing. [PDF]
Wu C +12 more
europepmc +1 more source
Atomic Force Microscopy (AFM)-Based Metrology for Advanced Etching in Three-Dimensional Integrated Circuits. [PDF]
Chang J +4 more
europepmc +1 more source
EPE contribution analysis method of multiple patterning lithography by Monte Carlo and Sobol sensitivity analysis. [PDF]
Ai F, Su X, Su Y, Wei Y.
europepmc +1 more source
Peter Parshall (ed.), The Darker Side of Light - Arts of Privacy 1850-1900
Muriel Adrien
doaj
Synthesis and advanced applications of MXene nanosheets in energy storage, EMI shielding, and biomedicine: a review. [PDF]
Ghobashy MM +6 more
europepmc +1 more source

