Results 41 to 50 of about 39,799 (70)
Increase of the reliability of information systems depends on the reliability improvement of their component elements, including cooling devices, providing efficiency of thermally loaded components. Thermoelectric devices based on the Peltier effect have
V. P. Zaikov +3 more
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To Burn-In, or Not to Burn-In: That’s the Question
In this paper it is shown that the bathtub-curve (BTC) based time-derivative of the failure rate at the initial moment of time can be considered as a suitable criterion of whether burn-in testing (BIT) should or does not have to be conducted.
Ephraim Suhir
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This paper proposes an improved single‐source switched‐capacitor inverter that can operate either as 7 or 9‐level inverter based on its capacitors' charging scenario.
Armin Ghelichi +2 more
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Some Properties of Gamma Generated Distributions
Based on standard probability distributions, new families of univariate distributions have been introduced and their properties studied by many authors.
Manisha Pal, Montip Tiensuwan
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Predicting of parameters of reliability two-cascade thermoelectrical cooling device in a mode Q0max [PDF]
The parities for an estimation of parameters of reliability two-cascade ТED of a various design depending on their basic parameters in a mode Q0max are received.
Khramova L. F. +3 more
doaj
BackgroundThe conventional midline approach for lumbar puncture (MAT-LP) has a relatively low success rate of 70%. The paramedian approach can increase the effective puncture area and success rate but lacks standardized guidelines. This study evaluated a
Yuan-Dong Zhuang +7 more
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The new generalized inverse Weibull distribution
Failure rate is one of the important concepts in reliability theory. In this paper, we introduce a new distribution function containing four parameters based on inverse Weibull distribution.
A Dostmoradi, M Zadkarami, V Bahrami
doaj
A New One-Parameter Model by Extending Maxwell–Boltzmann Theory to Discrete Lifetime Modeling
The Maxwell–Boltzmann (MB) distribution is fundamental in statistical physics, providing an exact description of particle speed or energy distributions.
Ahmed Elshahhat +2 more
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Reliability Evaluation of High Power Semiconductors
It described the modern reliability engineering based on math and physics. The reliability problems of power semiconductor devices were introduced. Three major acceleration tests were described by means of 4045 IGCT device and related failure rate curves
ZHANG Ming
doaj
The model of interrelation of reliability indicators and the basic significant parameters of the two-cascade thermoelectric cooling device (TED) with consecutive electric connection of cascades is considered.
D. P. Socheslav
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