Results 251 to 260 of about 3,149,182 (297)
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1991, Proceedings. International Test Conference, 2002
The authors compare the performance of two test generation techniques, stuck fault testing and current testing, when applied to CMOS bridging faults. Accurate simulation of such faults mandated the development of several new design automation tools, including an analog-digital fault simulator. The results of this simulation are analyzed.
Thomas M. Storey, Wojciech Maly
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The authors compare the performance of two test generation techniques, stuck fault testing and current testing, when applied to CMOS bridging faults. Accurate simulation of such faults mandated the development of several new design automation tools, including an analog-digital fault simulator. The results of this simulation are analyzed.
Thomas M. Storey, Wojciech Maly
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On fault detectability and isolability
1999 European Control Conference (ECC), 1999zbMATH Open Web Interface contents unavailable due to conflicting licenses.
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A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection
IEEE Transactions on Industrial Electronics, 2011This paper introduces a method to detect a fault associated with critical components/subsystems of an engineered system. It is required, in this case, to detect the fault condition as early as possible, with specified degree of confidence and a prescribed false alarm rate.
Bin Zhang 0008 +5 more
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2001
Fault detection and isolation are important elements of fault tolerant control systems as discussed in Chapter 8. This chapter outlines the current state of the art of fault detection and isolation (FDI) for the purpose of designing fault-tolerant control systems. Signal-based as well as quantitative and qualitative model-based approaches are explained,
Chen, J. +4 more
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Fault detection and isolation are important elements of fault tolerant control systems as discussed in Chapter 8. This chapter outlines the current state of the art of fault detection and isolation (FDI) for the purpose of designing fault-tolerant control systems. Signal-based as well as quantitative and qualitative model-based approaches are explained,
Chen, J. +4 more
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Fault detection with multiple observers
[Proceedings] IEEE INFOCOM '92: The Conference on Computer Communications, 1992The authors propose to use a set of independent observers to detect faults in communication systems that are modeled by finite-state machines. An algorithm for constructing these observers and a fast real-time fault detection mechanism used by each observer are given.
Clark Wang, Mischa Schwartz
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Fault Detection of Descriptor Systems
IFAC Proceedings Volumes, 2006Abstract This paper is concerned with the fault detection problem of descriptor systems. First, an approach is proposed to design a normal observer based residual generator for descriptor systems by exploring the relationship between parity space based and observer based residual generators.
Zhang, Ping, Ding, Steven X.
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2020
Understanding Faults: Detecting, Dating, and Modeling offers a single resource for analyzing faults for a variety of applications, from hazard detection and earthquake processes, to geophysical exploration. The book presents the latest research, including fault dating using new mineral growth, fault reactivation, and fault modeling, and also helps ...
Tanner, D. +8 more
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Understanding Faults: Detecting, Dating, and Modeling offers a single resource for analyzing faults for a variety of applications, from hazard detection and earthquake processes, to geophysical exploration. The book presents the latest research, including fault dating using new mineral growth, fault reactivation, and fault modeling, and also helps ...
Tanner, D. +8 more
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Proceedings of the December 9-11, 1968, fall joint computer conference, part II on - AFIPS '68 (Fall, part II), 1968
One of the most pressing problems currently confronting the design automation specialist is that of the automatic generation of component failure detection and diagnostic test sequences. This problem is made more difficult due to the new LSI circuits where we may have hundreds of components on a chip with only a few accessible input/output terminals.
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One of the most pressing problems currently confronting the design automation specialist is that of the automatic generation of component failure detection and diagnostic test sequences. This problem is made more difficult due to the new LSI circuits where we may have hundreds of components on a chip with only a few accessible input/output terminals.
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Fault detection and diagnosis of memory system faults
Proceedings of the June 1971 design automation workshop on Design automation - DAC '71, 1971Algorithms for the detection and diagnosis of faults in semiconductor random-access, word-organized memory systems are presented and evaluated. The memory system is conceptually partitioned into four major elements to facilitate analysis. During the testing of each element, previously tested elements are assumed to be fault-free, but untested elements ...
A. R. Klayton +2 more
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Fault Detection of Actuator Faults for Electric Vehicle
2007 IEEE International Conference on Control Applications, 2007The main purposes of this paper concern: fault generation of nonlinear analytical redundancy for actuator faults of electric vehicle. These relations are used to detect and isolate actuator fault based on the elimination of the unknown variables of the system. Each residual, obtained by elimination theory, is sensitive to only one actuator fault thanks
Pierre-Emmanuel Dumont +2 more
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