Results 251 to 260 of about 331,594 (307)
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Proceedings of the 15th International Conference on Availability, Reliability and Security, 2020
With silicon technology decreasing in size, memories get more susceptible to external influences, which can lead to soft errors. Although temporary, these errors constitute a challenge for safety-critical systems. Redundancy-based error detection is commonly used in industry to increase safety and mitigate these errors.
Leo Botler +3 more
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With silicon technology decreasing in size, memories get more susceptible to external influences, which can lead to soft errors. Although temporary, these errors constitute a challenge for safety-critical systems. Redundancy-based error detection is commonly used in industry to increase safety and mitigate these errors.
Leo Botler +3 more
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1991, Proceedings. International Test Conference, 2002
The authors compare the performance of two test generation techniques, stuck fault testing and current testing, when applied to CMOS bridging faults. Accurate simulation of such faults mandated the development of several new design automation tools, including an analog-digital fault simulator. The results of this simulation are analyzed.
T.M. Storey, W. Maly
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The authors compare the performance of two test generation techniques, stuck fault testing and current testing, when applied to CMOS bridging faults. Accurate simulation of such faults mandated the development of several new design automation tools, including an analog-digital fault simulator. The results of this simulation are analyzed.
T.M. Storey, W. Maly
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Fault Detection of Descriptor Systems
IFAC Proceedings Volumes, 2006Abstract This paper is concerned with the fault detection problem of descriptor systems. First, an approach is proposed to design a normal observer based residual generator for descriptor systems by exploring the relationship between parity space based and observer based residual generators.
Zhang, Ping, Ding, Steven X.
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Fuzzy Fault Tree Based Fault Detection
2012 Sixth International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing, 2012In this article, for the Linux operating system environment, with the characteristics of ambiguity and uncertainty for the occurrence probability of system failures, fuzzy theory is introduced into the fault tree analysis. The occurrence probability of basic events in the conventional fault tree is made fuzzy by introducing the concept of fuzzy sets ...
Yuening Kang +4 more
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Logical method for detecting faults by fault detection table
2010 East-West Design & Test Symposium (EWDTS), 2010Algebro-logic vector method for diagnosing faults of systems and their components based on the use a fault detection table and transactional graph, is proposed. The method allows decreasing the verification time of software model.
Vladimir Hahanov +2 more
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Detection of Anesthesia Machine Faults
Anesthesia & Analgesia, 1984One hundred ninety people attending an anesthesia meeting were given ten minutes to identify five faults intentionally created in a standard anesthesia machine. 7.3% of participants found no machine faults and 3.4% found all five faults. The average number of identified faults was 2.2.
C W, Buffington +2 more
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Polynomially Complete Fault Detection Problems
IEEE Transactions on Computers, 1975We look at several variations of the single fault detection problem for combinational logic circuits and show that deciding whether single faults are detectable by input-output (I/O) experiments is polynomially complete, i.e., there is a polynomial time algorithm to decide if these single faults are detectable if and only if there is a polynomial time ...
Ibarra, Oscar H., Sahni, Sartaj K.
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Proceedings of the December 9-11, 1968, fall joint computer conference, part II on - AFIPS '68 (Fall, part II), 1968
One of the most pressing problems currently confronting the design automation specialist is that of the automatic generation of component failure detection and diagnostic test sequences. This problem is made more difficult due to the new LSI circuits where we may have hundreds of components on a chip with only a few accessible input/output terminals.
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One of the most pressing problems currently confronting the design automation specialist is that of the automatic generation of component failure detection and diagnostic test sequences. This problem is made more difficult due to the new LSI circuits where we may have hundreds of components on a chip with only a few accessible input/output terminals.
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Improvement of analog circuit fault detectability using fault detection observers
Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium, 2002Presents the application of fault detection observers as used in dynamic systems fault diagnosis to analog circuit testing. It will be shown that the fault detectability performance of fault detection observers is higher than those of optimal test vector generation methods which are based on maximising the differences of directly compared responses ...
W. Vermeiren, B. Straube, G. Elst
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Robust multiple‐fault detection filter
International Journal of Robust and Nonlinear Control, 2002AbstractA new robust multiple‐fault detection and identification algorithm is determined. Different from other algorithms which explicitly force the geometric structure by using eigenstructure assignment or geometric theory, this algorithm is derived from solving an optimization problem. The output error is divided into several subspaces.
Chen, Robert H., Speyer, Jason L.
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