Results 251 to 260 of about 8,566 (306)

An algorithm for diagnostic fault simulation

2010 11th Latin American Test Workshop, 2010
In diagnostic testing faults detectable by test vectors are partitioned into groups. This partitioning is such that a fault is distinguishable from faults in all other groups, but is indistinguishable from those in its own group. Diagnostic fault coverage (DC) is defined as the number of fault groups divided by the total number of faults.
Yu Zhang, Vishwani D. Agrawal
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Fault Diagnostics of Rotating Machinery

2011 21st International Conference on Systems Engineering, 2011
This research extends the concept of [Lehrasab, 1999] to the domain of rotating machines. It aims at developing novel fault diagnostics techniques for the motor or rotating machines for diagnostics that is costeffective and easier to deploy from industrial perspective.
Z. Mahmood, N. S. Khattak
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Integrated fault diagnostics on the grid

Proceedings. Ninth IEEE International Conference on Engineering of Complex Computer Systems, 2004
Model-based methods are commonly used for fault diagnosis. Many model-based fault diagnosis approaches have been proposed so far. But for modern complex processes, due to the variable nature of faults and model uncertainty, no single approach can diagnose all faults and meet different contradictory criteria. In this paper, the importance of integration
Xiaoxu Ren, Max Ong, Geoffrey Allan, Visakan Kadirkamanathan, Haydn A. Thompson, Peter J. Fleming   +5 more
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Real-time fault diagnostics

IEEE Expert, 1991
The intelligent process control system (IPCS), an integrated environment for developing complex process control and automation systems is discussed, focusing on its real-time fault diagnostics capability. IPCS has been used to build a supervisory monitoring and diagnostics system for a cogenerator plant.
Samir Padalkar, Gabor Karsai, Csaba Biegl, Janos Sztipanovits, Koji Okuda, Nobuji Miyasaka   +5 more
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Fault diagnostics and fault tolerant control

IEEE Transactions on Aerospace and Electronic Systems, 1998
A novel simultaneous fault detection and diagnostics (FDD) and fault tolerant control (FTC) strategy for nonlinear stochastic systems in closed loops based on a continuous stirred tank reactor (CSTR) is presented. The purpose of control is to track the reactant concentration setpoint.
D.H. Zhou, P.M. Frank
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A diagnostic fault simulator for fast diagnosis of bridge faults

Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013), 1999
A new diagnostic fault simulator is described that diagnoses both feedback and non-feedback bridge faults while using information from fault simulation of single stuck-at faults. A realistic fault model is used which considers the existence of the Byzantine Generals Problem. The approach has been demonstrated for two-line bridge faults on several large
Jue Wu, Elizabeth M. Rudnick
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Diagnostic Fault Simulation of Sequential Circuits

Proceedings International Test Conference 1992, 2005
In this work we describe a diagnostic fault simulator for sequential circuits which evaluates the effectiveness of a given test set in distinguishing between faults. Diagnostic fault simulation is performed on several ISCAS89 sequential benchmark circuits using two diferent deterministic test sets for each circuit.
Elizabeth M. Rudnick, W. Kent Fuchs, Janak H. Patel   +2 more
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Diagnostic Test Generation for Arbitrary Faults

2006 IEEE International Test Conference, 2006
It is now generally accepted that the stuck-at fault model is no longer sufficient for many manufacturing test activities. Consequently, diagnostic test pattern generation based solely on distinguishing stuck-at faults is unlikely to achieve the resolution required for emerging fault types.
Naresh K. Bhatti, Ronald D. Blanton
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Fault isolation in an integrated diagnostic environment

IEEE Design & Test of Computers, 1993
The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed. >
William R. Simpson, John W. Sheppard
openaire   +1 more source