Results 131 to 140 of about 20,765 (306)

The Effect of Hydraulic Fracturing on the 2021 Ms 6.0 Luxian Earthquake as Revealed by Deformation and Numerical Simulations

Geophysical Research Letters
This study investigates whether hydraulic fracturing contributed to the 2021 Ms 6.0 Luxian earthquake in the Sichuan Basin. Time‐series InSAR analysis of multi‐temporal Sentinel‐1 data reveals coseismic deformation associated with the 2021 Luxian ...
Xiaoran Fan, Guohong Zhang, Yosuke Aoki, Xinjian Shan   +3 more
doaj   +1 more source

Cathodic Cage Plasma Deposition of Nanostructured Cu–Fe–Se Coatings on Poly(methyl Methacrylate)

Advanced Engineering Materials, EarlyView.
Nanostructured Cu–Fe–Se coatings are deposited on PMMA by a modified cathodic cage plasma process, enabling low‐temperature deposition on polymer substrates. A transition from discontinuous to compact morphology is observed with temperature, with optimal properties at 200°C, where improved CuFeSe2‐type bonding, lowest sheet resistance, and favorable ...
V. S. S. Sobrinho, M. Naeem, T. H. C. Costa, M. S. Libório, J. C. A. Queiroz, C. B. B. Luna, R. R. M. Sousa, P. S. Vieira, E. M. Araújo   +8 more
wiley   +1 more source

Microstructure Reconstruction in Battery Electrodes Using Machine Learning Based on Low‐Voltage Focused Ion Beam–Scanning Electron Microscopy Tomography Images

Advanced Engineering Materials, EarlyView.
Low‐voltage FIB‐SEM tomography combined with a image preprocessing pipeline improves phase contrast and enables reliable machine‐learning segmentation of conductive networks in lithium‐ion battery electrodes. Structural descriptors are extracted from segmented images, done semimanually and automated, and compared.
Lisa Beran, Vincent Nebel, Dominik Perius, Kshitij Kumar, Yannis Heim, Laura Bies, Tobias Kraus   +6 more
wiley   +1 more source

Software implemented fault tolerance for microprocessor controllers: fault tolerance for microprocessor controllers [PDF]

, 1992
It is generally accepted that transient faults are a major cause of failure in micro processor systems. Industrial controllers with embedded microprocessors are particularly at risk from this type of failure because their working environments are prone ...
Wingate, Guy A.S.
core  

Research on Fault Injection Method of Train MVB Bus

机车电传动, 2019
In order to extract the characteristics of the vehicle communication network fault data in different operating states and test the network performance under different performance degradation degrees, so as to facilitate the research of network fault ...
Hui SONG, Lide WANG, Zhaozhao LI, Xiaomin DU   +3 more
doaj  

Reconfigurable Logic‐in‐Memory Operations Enabled by Triple‐Gated Feedback Field‐Effect Transistors for Area‐Efficient Computing

Advanced Engineering Materials, EarlyView.
A reconfigurable logic‐in‐memory cell composed of triple‐gated feedback field‐effect transistors implements multiple combinational logic functions within a single configuration. By utilizing program gates as dynamic input terminals, the proposed cell performs full adder, full subtractor, 2‐to‐1 multiplexer, and 4‐to‐2 encoder operations without ...
Minhyeok Seol, Yunwoo Shin, Donghyung Lee, Dongki Kim, Kyoungah Cho, Sangsig Kim   +5 more
wiley   +1 more source

Optoelectronic Synaptic Devices Using Molecular Telluride Phase‐Change Inks for Three‐Factor Learning

Advanced Functional Materials, EarlyView.
Optoelectronic synaptic devices based on solution‐processed molecular telluride GST‐225 phase‐change inks are demonstrated for three‐factor learning. A global optical signal broadcast through a silicon waveguide induces non‐volatile conductance updates exclusively in locally electrically flagged memristors.
Kevin Portner, Dhananjeya Kumaar, Giacomo Torti, Killian Keller, Till Zellweger, Florian M. Schenk, Christoph Weilenmann, Daniel Chelladurai, Vara Prasad Jonnalagadda, Ghazi Sarwat Syed, Vanessa Wood, Jürg Leuthold, Alexandros Emboras, Maksym Yarema, Mathieu Luisier   +14 more
wiley   +1 more source

Oxygen‐Tunnel Indium Tin Oxide Vertical Channel Transistors with Enhanced Current Density and Reliability for Monolithic 3D Compute‐In‐Memory Systems

Advanced Functional Materials, EarlyView.
Oxygen‐tunnel (OT) indium tin oxide (ITO) vertical channel transistors (VCTs) enable reliable, high‐density gain‐cell memory for monolithic 3D integration. A sandwiched SiN/SiO2/SiN OT stack selectively regulates oxygen transport, suppressing parasitic electrode oxidation while stabilizing channel oxygen vacancies, thereby suppressing carrier injection
Hyeonho Gu, Haksoon Jung, Yongwoo Lee, Hoichang Jeong, Yanfeng Zhao, Heesoo Yang, Minho Park, Hyeonjin Lee, Seunghun Baek, Minju Song, Junghwan Kim, Youngmin Jo, Hyunjin Park, Munhyeon Kim, Jae‐Joon Kim, Kyuho Jason Lee, Byungjo Kim, Jimin Kwon   +17 more
wiley   +1 more source

Concepção e validação de arquitetura robusta baseada em soft processors para uso em computadores de bordo de satélites artificiais [PDF]

, 2013
Dissertação (mestrado) - Universidade Federal de Santa Catarina, Centro Tecnológico, Programa de Pós-Graduação em Engenharia Elétrica, Florianópolis, 2013.A flexibilidade introduzida pela utilização de FPGAs (Field Programmable Gate Array) SRAM ...
Silva, Felipe Augusto da
core  

Switching Off your Device Does Not Protect Against Fault Attacks

Transactions on Cryptographic Hardware and Embedded Systems
Physical attacks, and among them fault injection attacks, are a significant threat to the security of embedded systems. Among the means of fault injection, laser has the significant advantage of being extremely spatially accurate.
Paul Grandamme, Pierre-Antoine Tissot, Lilian Bossuet, Jean-Max Dutertre, Brice Colombier, Vincent Grosso   +5 more
doaj   +1 more source