Results 141 to 150 of about 695,002 (396)
Chemical engineering research & design, 2022 Zeinab Masalegooyan +2 more
semanticscholar +1 more source
Advanced Functional Materials, EarlyView.In‐situ doping during growth of SnSe and subsequent attachment of SnS produces high‐quality lateral pn‐heterojunctions between van der Waals semiconductors. Electron beam induced current measurements demonstrate electrically active pn‐junctions, paving the way for devices that harness charge separation at lateral interfaces in layered heterostructures.
Peter Sutter +4 more
wiley +1 more source
Fault tree and reliability analysis [PDF]
, 1977 Originally presented as the first author's thesis, (Sc. D.)--in the M.I.T. Dept. of Nuclear Engineering, 1977Includes bibliographical references (p.
Olmos, Jaime, Wolf Lothar
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Contact Lens with Moiré Patterns for High‐Precision Eye Tracking
Advanced Functional Materials, EarlyView.This work presents a passive contact lens for high‐precision eye tracking, integrating a microscopic moiré grating label. The parallax‐induced shift of macroscopic moiré patterns enables angle measurement with 0.28° precision using a standard camera under ambient light.
Ilia M. Fradkin +11 more
wiley +1 more source
Advanced Functional Materials, EarlyView.A novel approach for the design of functional semiconductors is presented, which utilizes the excellent optoelectronic properties of layered hybrid perovskites and the possibility to introduce a molecular photoswitch as the organic spacer. This concept is successfully demonstrated on a coumarin‐based system with the possibility to change the bandgap ...
Oliver Treske +4 more
wiley +1 more source
Analisis Penyebab Tidak Tercapainya Target Dwelling TIME Menggunakan Metode Fault Tree Analysis, Studi Kasus: Pelabuhan Tanjung Priok (Pelindo II) [PDF]
, 2016 Analysis of the causes of not achieving the goal dwelling time using fault tree analysis method. Port management is not available standard problem when a target triggers the acceleration of service at the port that is now in the spotlight important cause
Ruwantono, I. M. (Ilham) +1 more
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Advanced Functional Materials, EarlyView.A 3D nanowire‐network SERS substrate with robust adhesion is developed, featuring pronounced z‐direction optical activity, ultralow detection limit (1.5 × 10−13 M), and excellent signal uniformity (RSD < 10%). Enabled by enhanced light scattering, increased optical density of states, and structural reinforcement, the substrate demonstrates stable, high‐
Jinglai Duan +6 more
wiley +1 more source
A Comprehensive Investigation on the Fire Hazards and Environmental Risks in a Commercial Complex Based on Fault Tree Analysis and the Analytic Hierarchy Process. [PDF]
Int J Environ Res Public Health, 2020 Wang Y, Ni X, Wang J, Hu Z, Lu K.
europepmc +1 more source
Monte Carlo Simulation of Markov, Semi-Markov, and Generalized Semi- Markov Processes in Probabilistic Risk Assessment [PDF]
A standard tool of reliability analysis used at NASA-JSC is the event tree. An event tree is simply a probability tree, with the probabilities determining the next step through the tree specified at each node.
English, Thomas
core +1 more source
Method and system for dynamic probabilistic risk assessment [PDF]
, 2013 The DEFT methodology, system and computer readable medium extends the applicability of the PRA (Probabilistic Risk Assessment) methodology to computer-based systems, by allowing DFT (Dynamic Fault Tree) nodes as pivot nodes in the Event Tree (ET) model ...
Dugan, Joanne Bechta, Xu, Hong
core +1 more source