Results 151 to 160 of about 19,544,767 (297)

Basic Computations in Fault Tree Analysis

open access: yesCoRR
Fault Tree Analysis (FTA) is a well-established method in failure analysis and is widely used in safety and reliability assessments. While FTA tools enable users to manage complex analyses effectively, they can sometimes obscure the underlying calculation processes.
openaire   +3 more sources

Fault Tree Analysis: A Bibliography

open access: yes, 2000
Fault tree analysis is a top-down approach to the identification of process hazards. It is as one of the best methods for systematically identifying an graphically displaying the many ways some things can go wrong.

core  

Evolution of OLED Lamination Technology With Development of Display Form Factors

open access: yesAdvanced Materials Technologies, EarlyView.
This review evaluates the evolution of organic light‐emitting diode (OLED) lamination technologies alongside advancing display form factors. It contrasts optically clear adhesives and resins, highlighting uniformity control for rigid screens, bubble‐free optimization for bended architectures, and visible‐light curing for foldable layers.
Kwan‐Young Han, Ji‐Hoon Park
wiley   +1 more source

In Situ Two‐Dimensional Residual Stress Characterization of Thin Films

open access: yesAdvanced Materials Technologies, EarlyView.
An integrated in situ curvature metrology platform combining speckle‐based curvature optical metrology (SCOM) with multi‐beam optical sensors (MOS) enables spatially resolved two‐dimensional curvature mapping of thick sputtered coatings. The SCOM technique provides excellent agreement with MOS while providing an extended measurable curvature range ...
Wai Jue Tan   +6 more
wiley   +1 more source

Defect‐Engineered ZnO Nanowire Arrays for Flexible Room‐Temperature Hydrogen Sensors

open access: yesAdvanced Materials Technologies, EarlyView.
Fabrication process of patterned ZnO nucleation sites on a flexible polyimide (PI) substrate. Top/tilted‐view SEM images of ordered ZnO nanoflower arrays confined within patterned circular regions. AFM topography map with height data revealing a disk‐array structure, where the patterned regions (marked by a red dot circle) are elevated by ∼2 µm ...
Jun‐Ting Wang   +7 more
wiley   +1 more source

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