Results 141 to 150 of about 76,083 (289)
Screening of the bound polarization charges of ferroelectrics at electrode interfaces is accommodated either by electrode charges or by charge injection. By means of X‐ray photoelectron spectroscopy with in‐situ polarization reversal, it is demonstrated that screening charges at antiferroelectric La‐doped Pb(Zr,Ti)O3 are injected, while they remain at ...
Binxiang Huang +6 more
wiley +1 more source
Ferroelectric Properties of Bilayer MoS<sub>2</sub>/WS<sub>2</sub> Heterostructure Modulated by Twist Angle. [PDF]
Wang L +12 more
europepmc +1 more source
A practical method to predict voltage‐controlled magnetic anisotropy (VCMA) efficiency through capacitance–voltage (C–V) measurements is demonstrated. HfO2 dielectric exhibiting strong redox activity demonstrate enhanced VCMA accompanied by electrochemical C–V characteristics.
Ji‐Hyeon Yun +7 more
wiley +1 more source
Interfacial ferroelectricity unlocks stable formamidinium-based perovskites. [PDF]
Wang Y +11 more
europepmc +1 more source
Fast Photonic Switches with Ferroelectric Films
Alexei L. Glebov +2 more
openalex +1 more source
The article overviews past and current efforts on caloric materials and systems, highlighting the contributions of Ames National Laboratory to the field. Solid‐state caloric heat pumping is an innovative method that can be implemented in a wide range of cooling and heating applications.
Agata Czernuszewicz +5 more
wiley +1 more source
A stable monoclinic variant and resultant robust ferroelectricity in single-crystalline hafnia-based films. [PDF]
Geng WR +7 more
europepmc +1 more source
Additive manufacturing revolutionizes production by enabling on‐demand, customized, and sustainable manufacturing with streamlined supply chains. While metal and polymer AM are well‐established, advanced ceramic AM is rapidly emerging, overcoming traditional material challenges.
Kateryna Oleksandrivna Shvydyuk +2 more
wiley +1 more source
Investigating the impact of 3D trench structures on HfO<sub>2</sub>-based ferroelectric capacitors. [PDF]
Zheng Z +7 more
europepmc +1 more source
Origin of the Critical Thickness in Improper Ferroelectric Thin Films
Alexander Vogel +8 more
openalex +2 more sources

