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Behavior of thick film resistors deposited on thick film dielectric layers
Microelectronics Reliability, 1971openaire +1 more source
FILM THICKNESS MEASURING METHOD AND FILM THICKNESS MEASURING DEVICE
2019KONDO KOJI +3 more
openaire +1 more source
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
2014YAMADA TAKEO +2 more
openaire +1 more source
Method and apparatus for measuring film thickness and film thickness growth
2004openaire +2 more sources

