Results 221 to 230 of about 2,318,874 (286)
Here, we develop a high‐throughput algorithm that accelerates the elucidation of phase diagrams of topological spin textures using limited computational resources at high numerical accuracy. Applying this framework to the van der Waals magnet CrSBr, we unveiled a hierarchy of previously unknown topological textures (domain‐wall bimerons, bimeron chains,
Andrew Lyall +4 more
wiley +1 more source
A triplet‐blocking layer controls triplet exciton dynamics in blue upconversion OLEDs. The layer keeps charge transfer (CT)‐generated triplet excitons inside the triplet‐triplet annihilation (TTA) host, suppresses anode‐side interfacial quenching, and increases the steady‐state triplet population.
Qing‐Jun Shui +5 more
wiley +1 more source
This work reveals the UV‐curing‐induced monomer‐rich domain, oligomer‐rich domain, and entangled oligomer domain. The cured submicron films in stressed state induce interlayer nano‐wrinkle structures during the deposition of the second layer. Stress‐free cured films in relaxed state form non‐diffusive, diffusive and semi‐diffusive interlayer ...
Shouzheng Chen +13 more
wiley +1 more source
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The thickness of the tear film
Current Eye Research, 2004Measurements of the thickness of the pre-corneal tear film, pre-lens tear film, post-lens tear film, and the lipid layer on the surface of the tear film are summarized. Spatial and temporal variations in tear film thickness are described. Theoretical predictions of tear film thickness are discussed.
P Ewen, King-Smith +4 more
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Sensors and Actuators A: Physical, 1990
Abstract This paper outlines the continuous progress of thick-film technology in providing a valuable means for the manufacture of solid-state sensors in three major areas of applications: hybrid circuits for signal processing, creation of structures upon which sensing materials can be added to provide new forms of sensors and thick-film materials ...
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Abstract This paper outlines the continuous progress of thick-film technology in providing a valuable means for the manufacture of solid-state sensors in three major areas of applications: hybrid circuits for signal processing, creation of structures upon which sensing materials can be added to provide new forms of sensors and thick-film materials ...
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Characterization of thin-film thickness
Metrologia, 2014Analysis methods and instrumentation for obtaining optical parameters and thickness profiles of thin-film samples from spectrophotometric and ellipsometric measurements are presented. Measured samples include thermally grown and evaporated SiO2 on a silicon substrate and a polymer photoresist layer on silicon.
Pourjamal, Sara +6 more
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The limiting thickness of protein films
Journal of Colloid and Interface Science, 1967Abstract The thinning of microscopic lamellae formed from solutions of bovine serum albumen and bovine γ-globulin has been studied by a modification of the method of Scheludko. Provided the surfaces were cleaned to remove coagulated material, fairly persistent, uniform films were obtained in certain pH ranges.
P R, Mussellwhite, J A, Kitchener
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Lonsdaleite Films with Nanometer Thickness
The Journal of Physical Chemistry Letters, 2014We investigate the properties of potentially the stiffest quasi-2-D films with lonsdaleite structure. Using a combination of ab initio and empirical potential approaches, we analyze the elastic properties of lonsdaleite films in both elastic and inelastic regimes and compare them with graphene and diamond films.
Alexander G, Kvashnin, Pavel B, Sorokin
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Film thickness of disclosing wax
The Journal of Prosthetic Dentistry, 1983lhe fitting of a removable partial denture framework or a metal crown against tooth structure can be facilitated by the aid of disclosing wax.’ This soft wax material is placed on surfaces of restorations that contact the teeth. After insertion and removal of the restorations, interferences will be visible as bright spots (Figs. 1 and 2).
D A, Kaiser, C E, Brukl, G C, Kiser
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Thickness Distribution in Thin Film
Japanese Journal of Applied Physics, 1977Abstract A thickness distribution function is used to describe the non-uniformity of thickness in thin films. A method to determine the thickness distribution function is proposed and applied to r.f. diode-sputtered ultrathin films of platinum deposited onto liquid-nitrogen-cooled quartz substrates.
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