A Comprehensive Review of Optical Metrology and Perception Technologies. [PDF]
Shan S, Zhao F, Li Z, Luo L, Li X.
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Deep Learning for Single-Shot Structured Light Profilometry: A Comprehensive Dataset and Performance Analysis. [PDF]
Evans RG +4 more
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Fast Three-Dimensional Profilometry with Large Depth of Field. [PDF]
Zhang W, Zhu J, Han Y, Zhang M, Li J.
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Single-Shot 3D Reconstruction via Nonlinear Fringe Transformation: Supervised and Unsupervised Learning Approaches. [PDF]
Nguyen AH, Wang Z.
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Dynamic 3D Measurement Based on Camera-Pixel Mismatch Correction and Hilbert Transform. [PDF]
Chen X, Zhang Q, Wang Y.
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Fast Multifrequency Phase Unwrapping Method Based on 3D Printing Object Appearance Acquisition. [PDF]
Zheng X, Wang Y, Du G, Yin S.
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Amplitude- and Phase-Programmable Dual-Color Photonic Chip for High-Contrast Structured Illumination Microscopy. [PDF]
Maran P +7 more
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Use of Phase-Angle Model for Full-Field 3D Reconstruction under Efficient Local Calibration. [PDF]
Lei F, Ma R, Li X.
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Phase Measuring Deflectometry for Wafer Thin-Film Stress Mapping. [PDF]
Gao Y +5 more
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