Results 61 to 70 of about 40,060 (297)

Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution

IEEE Access, 2020
Electronic devices are integral part of our life and modeling their lifetime is the most challenging and interesting field in reliability analysis. To investigate the failure behavior of electronic devices reliability analysis is commonly used.
Sajid Ali, Shafaqat Ali, Ismail Shah, Ghazanfar Farooq Siddiqui, Tanzila Saba, Amjad Rehman   +5 more
doaj   +1 more source

Some Methods to Estimate the Parameters of Generalized Exponential Rayleigh Model by Simulation

Iraqi Journal for Computer Science and Mathematics, 2023
This paper shews how to estimate the parameter of generalized exponential Rayleigh (GER) distribution by three estimation methods. The first one is maximum likelihood estimator method the second one is moment employing estimation method (MEM), the third
Rehab Noori Shalan, Iden Hassan Alkanani   +1 more
doaj   +1 more source

PERBANDINGAN METODE MLE BAYESIAN LOSS FUNCTION DALAM PENDUGAAN PARAMETER DISTRIBUSI INVERS RAYLEIGH

Jurnal Lebesgue, 2023
The purposes of this study are to estimate the scale parameter  of invers Rayleigh distribution under MLE, Bayesian Generalized square error loss function (SELF), and Bayesian LINEX loss function .
Muhammad Iqbal, Ferra Yanuar, Dodi Devianto   +2 more
doaj   +1 more source

Molecular Dynamics Studies of Shape Memory Polymers: From Bead–Spring Models to Atomistic Simulations

Advanced Engineering Materials, EarlyView.
Coarse‐grained (left) and atomistic (right) models of the shape memory polymer ESTANE ETE 75DT3 are shown schematically. The two representations bridge molecular detail and mesoscopic description. Both models capture shape memory behavior, linking segmental mobility and conformational relaxation of anisotropic chains to macroscopic recovery, and ...
Fathollah Varnik
wiley   +1 more source

Machine Learning‐Supported Analysis for Predicting and Visualizing Nonlinear Relationships Between Material Properties in Electroplated Chromium Layers

Advanced Engineering Materials, EarlyView.
This study applies machine learning regression to predict chromium layer thickness in decorative trivalent chromium electroplating, using 441 experiments from laboratory‐scale (1L) and pilot‐scale (14L) setups. Tree‐based models, particularly CatBoost, outperformed linear regression by capturing nonlinear parameter interactions (R2$R^2$ up to 0.77 ...
Christoph Baumer, Christopher Mai, Luca Eisentraut, Andreas Bund, Ricardo Buettner   +4 more
wiley   +1 more source

A New Family of Distributions Based on the Hypoexponential Distribution with Fitting Reliability Data

Statistica, 2018
In this paper, a new general family of distributions using the hypoexponential distribution is introduced and studied. A special case of this family is explored in detail, corresponding to a new finite generalized mixture of generalized exponential ...
Christophe Chesneau
doaj   +1 more source

On the Generalized Exponentiated Exponential Lindley Distribution [PDF]

Journal of Data Science, 2021
Hok Shing Kwong, Saralees Nadarajah
openaire   +1 more source

Topp Leone Exponential – Generalized Inverted Exponential Distribution Properties and Application

, 2022
Abdulmuahymin Abiola Sanusi, Sani Ibrahim Doguwa, , and Abubakar Yahaya  In this paper, a new distribution called Topp Leone Exponential – Generalized Inverted Exponential distribution (TLE-GIE)is developed to improve on the flexibility of Topp Leone ...
Sani Ibrahim Doguwa, Abdulmuahymin Abiola Sanusi, Abubakar Yahaya, Yakubu Mamman Baraya   +3 more
core  

All‐in‐One Analog AI Hardware: On‐Chip Training and Inference with Conductive‐Metal‐Oxide/HfOx ReRAM Devices

Advanced Functional Materials, EarlyView.
An all‐in‐one analog AI accelerator is presented, enabling on‐chip training, weight retention, and long‐term inference acceleration. It leverages a BEOL‐integrated CMO/HfOx ReRAM array with low‐voltage operation (<1.5 V), multi‐bit capability over 32 states, low programming noise (10 nS), and near‐ideal weight transfer.
Donato Francesco Falcone, Victoria Clerico, Wooseok Choi, Tommaso Stecconi, Folkert Horst, Laura Bégon‐Lours, Matteo Galetta, Antonio La Porta, Nikhil Garg, Fabien Alibart, Bert Jan Offrein, Valeria Bragaglia   +11 more
wiley   +1 more source

Concomitants of Dual Generalized Order Statistics from Morgenstern Type Bivariate Generalized Exponential Distribution [PDF]

Journal of Statistical Theory and Applications (JSTA), 2015
[9] introduced the concept of dual generalized order statistics (dgos) that enables a common approach to descending ordered random variables like reversed order statistics and lower record values.
Saeid Tahmasebi, Ali Akbar Jafari, Mahmoud Afshari   +2 more
doaj   +1 more source