Results 111 to 120 of about 2,452 (221)

An evidence of defect gettering in GaN

open access: yes, 2008
The effect of Neon ion implantation on the structural and optical properties of MOCVD grown GaN was studied. X-ray diffraction and low temperature photoluminescence measurements were carried out on the implanted samples annealed at 900 degrees C.
Yang H   +5 more
core  

Hierarchical Super-Hydrophilic Aluminum Oxide Architectures on Textured Silicon for Aqueous- and Vapor-Phase Interaction

open access: yesChemosensors
Hierarchical super-hydrophilic surfaces were realized by forming porous anodic aluminum oxide (AAO) and boehmite [AlO(OH)] on micro-textured Si wafers.
Hyo-Ryoung Lim   +5 more
doaj   +1 more source

Wafer-Scale Room-Temperature Bonding of Smooth Au/Ti-Based Getter Layer for Vacuum Packaging. [PDF]

open access: yesSensors (Basel), 2022
Matsumae T   +6 more
europepmc   +1 more source

Gettering Technology Based on Porous Silicon

open access: yes, 2002
This paper briefly reviews a gettering technology based on porous silicon (PS). PS layers shown to have effective gettering properties for fast-diffusing impurities.
L. DOLGYI   +5 more
core   +1 more source

The Physical mechanisms of gettering properties of nickel clusters in silicon solar cells

open access: yesPhysical Sciences and Technology
This study demonstrates that the concentration of nickel atoms near the surface of solar cells is 2–3 orders of magnitude higher than in the bulk material, significantly enhancing the gettering rate at the surface. Using IR-microscopy, SEM, and SIMS, we
Zoir Kenzhaev   +6 more
doaj  

Development of silicon solar cells and photovoltaic modules in Brazil: analysis of a pilot production

open access: yesMaterials Research, 2012
Brazil is a country that receives a large amount of solar radiation. Moreover, high quality quartz mines has been found in its territory and the country has well-established metallurgical grade silicon industries.
Adriano Moehlecke, Izete Zanesco
doaj  

Investigations of impurity gettering in multicrystalline silicon

open access: yes, 2001
The processes of gettering the recombination-active impurities in multicrystalline silicon were investigated using methods of mass spectrometry of neutral atoms with the depth profile analysis and spectroscopy of a surface photovoltage (permitting to ...
Rassamakin, Yu.V.   +6 more
core   +1 more source

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