Results 111 to 120 of about 2,452 (221)
An evidence of defect gettering in GaN
The effect of Neon ion implantation on the structural and optical properties of MOCVD grown GaN was studied. X-ray diffraction and low temperature photoluminescence measurements were carried out on the implanted samples annealed at 900 degrees C.
Yang H +5 more
core
Hierarchical super-hydrophilic surfaces were realized by forming porous anodic aluminum oxide (AAO) and boehmite [AlO(OH)] on micro-textured Si wafers.
Hyo-Ryoung Lim +5 more
doaj +1 more source
Efficiency Improvement of Industrial Silicon Solar Cells by the POCl3 Diffusion Process. [PDF]
Xu X, Wu W, Wang Q.
europepmc +1 more source
Wafer-Scale Room-Temperature Bonding of Smooth Au/Ti-Based Getter Layer for Vacuum Packaging. [PDF]
Matsumae T +6 more
europepmc +1 more source
Gettering Technology Based on Porous Silicon
This paper briefly reviews a gettering technology based on porous silicon (PS). PS layers shown to have effective gettering properties for fast-diffusing impurities.
L. DOLGYI +5 more
core +1 more source
The Physical mechanisms of gettering properties of nickel clusters in silicon solar cells
This study demonstrates that the concentration of nickel atoms near the surface of solar cells is 2–3 orders of magnitude higher than in the bulk material, significantly enhancing the gettering rate at the surface. Using IR-microscopy, SEM, and SIMS, we
Zoir Kenzhaev +6 more
doaj
Brazil is a country that receives a large amount of solar radiation. Moreover, high quality quartz mines has been found in its territory and the country has well-established metallurgical grade silicon industries.
Adriano Moehlecke, Izete Zanesco
doaj
Isotopically Enriched Layers for Quantum Computers Formed by 28Si Implantation and Layer Exchange. [PDF]
Schneider E, England J.
europepmc +1 more source
Effect of Residual Oxygen Concentration on the Lattice Parameters of Aluminum Nitride Powder Prepared via Carbothermal Reduction Nitridation Reaction. [PDF]
Kim J, Ahn H, Kim SJ, Kim JY, Pee JH.
europepmc +1 more source
Investigations of impurity gettering in multicrystalline silicon
The processes of gettering the recombination-active impurities in multicrystalline silicon were investigated using methods of mass spectrometry of neutral atoms with the depth profile analysis and spectroscopy of a surface photovoltage (permitting to ...
Rassamakin, Yu.V. +6 more
core +1 more source

