Results 91 to 100 of about 246,221 (232)
Effect of Inductively Coupled Plasma Etching Parameters on n-Al0.5Ga0.5N Ohmic Contact
High-Al-content n-AlGaN ohmic contact is very important for deep ultraviolet optoelectrical devices. However, it often suffers from the etching damages formed in inductively coupled plasma (ICP) etching.
Shanshan Yang +10 more
doaj +1 more source
Analysis of Laboratory Animal Feed for Toxic and Essential Elements by Atomic Absorption and Inductively Coupled Argon Plasma Emission Spectrometry [PDF]
William M. Blakemore +1 more
openalex +1 more source
INDUCTIVELY COUPLED PLASMA AND ATOMIC FLUORESCENCE SPECTROMETRY
Omenetto, N., Cavalli, P., Rossi, G.
doaj +1 more source
Evaluation of H2 Plasma‐Induced Damage in Materials for EUV Lithography
Ultrafine semiconductor fabrication by lithography has undergone a significant transition from deep ultraviolet (DUV) to extreme ultraviolet (EUV) processes, which presents new challenges.
Eun‐Seok Choe +9 more
doaj +1 more source

