Results 261 to 270 of about 62,037 (289)

Hyperfine interaction of defects in insulators

Advances in Physics, 1973
Abstract The study of point defects, other than impurities, in insulators by electron paramagnetic resonance (E.P.R.) and electron nuclear double resonance (E.N.D.O.R.) is discussed. An introduction to the theory of the hyperfine spectra as obtained by E.P.R. and E.N.D.O.R.
B. Henderson, A.K. Garrison
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Stoichiometric defects in semi-insulating GaAs

Journal of Crystal Growth, 1997
The influences of arsenic interstitials and dislocations on the lattice parameters of undoped semi-insulating (SI) GaAs single crystals were analyzed. It was shown that the dislocations in such crystals serve as effective gettering sites for arsenic interstitials due to the deformation energy of dislocations.
NuoFu Chen, Hongjia He, Yutian Wang, Lanying Lin   +3 more
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Defects in Semi-Insulating SiC Substrates

Materials Science Forum, 2003
Electron paramagnetic resonance (EPR) was used to study defects in semi-insulating (SI) SiC substrates grown by high-temperature chemical vapour deposition (HTCVD) and physical vapour transport (PVT). The C vacancy, Si antisite and several other EPR centers, labelled SI-I to SI-8, were observed in the HTCVD and/or PVT 4H-SiC substrates.
Nguyen Tien Son, Björn Magnusson, Z. Zolnai, Alexsandre Ellison, Erik Janzén   +4 more
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Defects in undoped semi-insulating InP

SPIE Proceedings, 2014
This paper, the electron irradiation-induced defects in undoped InP has undergone a high-temperature annealing in iron phosphide ambience. The positron annihilation lifetime spectroscopy (PAL) and thermally stimulated current spectroscopy (TSC) have been employed to study it .
Yan Chen, Xin Guo
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Temporal Defects in Photonic Topological Insulators

Conference on Lasers and Electro-Optics, 2017
We experimentally study time-dependent defects in a waveguide model of a topological insulator. Backscattering is not observed, but in contrast to static defects, edge modes propagate through the defects.
Christina Jörg, Fabian Letscher, Michael Fleischhauer, Georg von Freymann   +3 more
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Defects in epitaxial insulating thin films

Journal of Physics: Condensed Matter, 1999
Defects on thin epitaxial insulator films of NaCl(100), KCl(100), and MgO(100) generated during growth and by electron bombardment are investigated by high-resolution spot profile analysis in low-energy electron diffraction (SPALEED), photoelectron spectroscopy (XPS, UPS), electron energy-loss spectroscopy (EELS), and thermal desorption spectroscopy ...
C Tegenkamp, H Pfnür, W Ernst, U Malaske, J Wollschläger, D Peterka, K M Schröder, V Zielasek, M Henzler   +8 more
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Electrical defect visualization in insulating Langmuir-Blodgett films

Thin Solid Films, 1989
Direct observation of conducting defects in Langmuir-Blodgett (LB) films by scanning electron microscopy (SEM) is unsuccessful because of defect size (around 50 nm according to literature). In the present paper, a decoration method is described which consists of a local electrochemical deposition of copper on the defects.
Bourgoin, Jean-Philippe, Palacin, Serge, Vandevyver, Michel, Barraud, André   +3 more
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Theory of defect complexes in insulators

Physical Review B, 2010
Defect complexes exhibit intricate electronic spectra, which can neither be described as a superposition of the constituent defect spectra, nor via conventional perturbative treatment applied thereupon. Instead, one must evaluate changes in the all-electron wave function in order to predict defect complex spectra.
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Insulation characteristics of epoxy insulator with internal void-shaped micro-defects

IEEE Transactions on Dielectrics and Electrical Insulation, 2013
Presently, an increasing number of gas insulated switchgear (GIS) has been operated for longer than 30 years, which is generally considered their service life. The degradation in solid insulators is considered to be one of the key factors determining the service life of such highly aged GIS in terms of insulation.
Genyo Ueta, Junichi Wada, Shigemitsu Okabe, Makoto Miyashita, Chieko Nishida, Mitsuhito Kamei   +5 more
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Insulation characteristics of epoxy insulator with internal delamination-shaped micro-defects

IEEE Transactions on Dielectrics and Electrical Insulation, 2013
The degradation characteristic of solid insulators is considered to be one of the key factors to perform a risk assessment of highly aged gas insulated switchgear (GIS). The present study experimentally obtained the insulation characteristics of epoxy insulator mainly with an internal microscopic delamination-shaped defect.
Genyo Ueta, Junichi Wada, Shigemitsu Okabe, Makoto Miyashita, Chieko Nishida, Mitsuhito Kamei   +5 more
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