Results 201 to 210 of about 116,428 (267)

Workflow for Fluorescence-Targeted Lamella Milling From Vitrified Cells With a Coincident Fluorescence, Electron, and Ion Beam Microscope. [PDF]

Bio Protoc
Perton EG, Boltje DB, Jakobi AJ, Hoogenboom JP.   +3 more
europepmc   +1 more source

Path‐Decoupled Cation‐Eutaxy III–V van der Waals Memristive Semiconductors for Mitigating the Neuromorphic Accuracy‐Energy Trade‐off

Advanced Materials, EarlyView.
Path‐decoupled III–V van der Waals memtransistors spatially separate ionic and electronic transport to overcome the conventional trade‐off between accuracy and energy in neuromorphic hardware. Mobile K+ ions in the vdW gaps set a wide conductance window, Gmax/Gmin, while gate‐tunable hole conduction lowers programming energy, enabling reliable ...
Jihong Bae, Ji Hoon Han, Taeyoung Kim, Jongbum Won, Seokmin Park, Gyu Won Kim, Sungsoon Kim, Hong Choi, Taehoon Kim, Hong‐Sub Lee, Jae‐Hyun Lee, Young Jin Choi, Jinwoo Cheon, Wooyoung Shim   +13 more
wiley   +1 more source

Controllable Fabrication of Gallium Ion Beam on Quartz Nanogrooves. [PDF]

Micromachines (Basel)
Mo P, Cheng J, Xu Q, Liu H, Wang C, Li S, Yuan Z.   +6 more
europepmc   +1 more source

Manipulating alternative end-joining alters carbon-ion beam-induced genome mutation profiles in Arabidopsis thaliana. [PDF]

DNA Res
Long J, Zhao J, Chen J, Ding J, Liu X, Li Z, Bian P, Wang T, Jin W, Lu X, Zhang Y, Zhou L, Du Y.   +12 more
europepmc   +1 more source

Correlative volume microcopy of virus-containing amphisomes enabled by fluorescence-guided focused ion beam-scanning electron microscopy. [PDF]

STAR Protoc
Lucas MS, Schmidt KW, Münz C.
europepmc   +1 more source

A comprehensive overview of focused ion beam-scanning electron microscopy (FIB-SEM) applications for the evaluation of outer retina. [PDF]

Front Cell Dev Biol
Ch S, Lim RR, Low SWY, Grant DG, Patterson S, Ramasubramanian A, Gadicherla AK, Chaurasia SS.   +7 more
europepmc   +1 more source

The synaptic organization of the human temporal lobe neocortex by high-resolution transmission, focused ion beam scanning, and electron microscopic tomography. [PDF]

Anat Sci Int
Rollenhagen A, Lübke JHR.
europepmc   +1 more source

Flexible and Transparent Ultrathin Gold Electrodes via Ion Beam Smoothing. [PDF]

Small Sci
Ferrando G, Mennucci C, Barelli M, Giordano MC, Buatier de Mongeot F.   +4 more
europepmc   +1 more source

A workflow for correlative <i>in situ</i> nanochip liquid cell transmission electron microscopy and atom probe tomography enabled by cryogenic plasma focused ion beam.

Nanoscale Horiz
Mulcahy N, Douglas JO, Jannat SR, Worch L, Topore G, Gault B, Ryan MP, Conroy MS.   +7 more
europepmc   +1 more source

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Ion beam, focused ion beam, and plasma discharge machining

CIRP Annals - Manufacturing Technology, 2009
Non-conventional methods of machining are used for many engineering applications where the traditional processes fail to be cost-effective. Such processes include Ion Beam Machining (IBM), focused ion beam (FIB) machining and plasma discharge machining.
P Shore, D M Allen
exaly   +2 more sources