Uniform monolayer Cr2Ge2Te6 films are achieved on Si substrates by molecular beam epitaxy. Intrinsic ferromagnetism with perpendicular magnetic anisotropy is established in the films by anomalous Hall effect and superconducting quantum interference device measurements, albeit with strong magnetic fluctuations characteristic of its 2D nature.
Pengfei Ji +15 more
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Heavy ion beam-induced variation in salt tolerance among <i>Leymus chinensis</i> genotypes during seed germination. [PDF]
Chen S +7 more
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Phase Engineering of Nanomaterials (PEN): Evolution, Current Challenges, and Future Opportunities
This review summarizes the synthesis, phase transition, advanced characterization spanning ex situ to in situ and operando techniques, and diverse applications of phase engineering of nanomaterials (PEN). It further outlines key challenges and future opportunities, such as phase stability, architecture control, and artificial intelligence (AI)‐driven ...
Ye Chen +7 more
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Evaluating metal-organic precursors for focused ion beam-induced deposition through solid-layer decomposition analysis. [PDF]
Jany BR +4 more
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A comparative analysis of gamma and neutron radiation shielding properties of Gd<sub>2</sub>O<sub>3</sub> nanoparticles within HDPE composites irradiated with argon ion beam. [PDF]
Shabib M +4 more
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Focused ion beam-induced platinum deposition with a low-temperature cesium ion source. [PDF]
Loeber TH +5 more
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Revealing Cycling-Induced Evolution of Intact Sodium Metal Battery Interfaces Using Cryo-Focused Ion Beam Cross-Sectioning and Electron Microscopy. [PDF]
Matthews KC +3 more
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Elemental Analysis of Coffee with Ion Beam Analytical Techniques. [PDF]
Debastiani R +5 more
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Subangstrom ion beam engineering of buried ultrathin oxides for scalable quantum computing. [PDF]
Smirnov NS +21 more
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Ion beam mixing by focused ion beam
Journal of Applied Physics, 2007Si amorphous (41 nm)/Cr polycrystalline (46 nm) multilayer structure was irradiated by 30 keV Ga+ ions with fluences in the range of 25−820 ions∕nm2 using a focused ion beam. The effect of irradiation on the concentration distribution was studied by Auger electron spectroscopy depth profiling, cross-sectional transmission electron microscopy, and ...
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