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Investigation on organic thin film transistors (TFT) by Kelvin probe force microscopy (KPFM)

Organic and Hybrid Field-Effect Transistors XIX, 2020
Using Kelvin Probe Force Microscopy (KPFM), we performed surface-potential measurements on operating organic thin-film transistors (TFTs). Several parameters inaccessible through current-voltage measurements were determined, namely the source and drain resistances separately, the threshold voltage and the electric field along the channel.
Mélanie Brouillard   +5 more
openaire   +1 more source

Coupling atomic scale modeling, fluid modeling and KPFM measurements to characterize an interface at nanoscale

2016 IEEE International Conference on Dielectrics (ICD), 2016
Understanding the behaviour of space charge in a solid organic dielectric under electrical stress remains to be a challenge for the development of more compact and reliable systems in the fields ranging from high voltage engineering and microelectronics to space applications.
Le Roy, Séverine   +3 more
openaire   +1 more source

Applications of KPFM-Based Approaches for Surface Potential and Electrochemical Measurements in Liquid

2018
Kelvin probe force microscopy (KPFM) has been widely used to map nanoscale surface potentials of materials in ambient and ultra-high vacuum environments. However, to study and ultimately understand charge-related processes, e.g., in biological systems or to further improve energy storage devices such as electrochemical batteries, nanoscale surface ...
Collins, Liam   +2 more
openaire   +1 more source

Correlated TERS and KPFM imaging of the SeMoS Janus monolayer crystals

Low-Dimensional Materials and Devices 2023, 2023
Andrey Krayev   +3 more
openaire   +1 more source

Surface potential of nanodiamonds investigated by KPFM

2017
Bohuslav Rezek, Stepan Stehlik
openaire   +1 more source

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