Results 241 to 250 of about 622,632 (303)
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Current leakage in bipolar electrocoagulation
Neurosurgery, 1983Bipolar electrocoagulation has previously been shown to give a considerable amount of current leakage to ground from either of the two outputs. This might result in unwanted tissue destruction. Thus far, no standard has been proposed for current leakage to ground from the outputs of bipolar equipment.
B, Vällfors +3 more
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Proceeding of the thirteenth international symposium on Low power electronics and design - ISLPED '08, 2008
Summary form only given. In only 5 years, leakage developed from an academic corner phenomenon to a central problem of embedded system design. In sub 90 nm designs the leakage power is already exceeding the dynamic power. The intention of this tutorial is to first review the mechanisms causing leakage and the parameters and imperfections causing ...
Wolfgang Nebel, Domenik Helms
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Summary form only given. In only 5 years, leakage developed from an academic corner phenomenon to a central problem of embedded system design. In sub 90 nm designs the leakage power is already exceeding the dynamic power. The intention of this tutorial is to first review the mechanisms causing leakage and the parameters and imperfections causing ...
Wolfgang Nebel, Domenik Helms
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Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides
IEEE Transactions on Nuclear Science, 1998Low-field leakage current has been measured in thin oxides after exposure to ionising radiation. This Radiation Induced Leakage Current (RILC) can be described as an inelastic tunnelling process mediated by neutral traps in the oxide, with an energy loss of about 1 eV.
M. Ceschia +4 more
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Leakage current sensing techniques
2017 Third International Conference on Sensing, Signal Processing and Security (ICSSS), 2017Present paper gives overview of leakage current sensing techniques. As it is important to monitor and maintain the leakage current at the lower side by engineers and electric companies, this paper describes the highlighted concepts of leakage current for general electrical devices or instruments.
Pallavi Shede, Sudhir Mane
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2002
We will present a method for the evaluation of the charge distribution and quantum-mechanical leakage currents in ultra-thin metal-insulator-semiconductor (MIS) gate stacks that may be composed of several layers of materials. Also the charge distribution due to the finite penetration depth inside the insulating material stack is obtained.
Wim Magnus, Wim Schoenmaker
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We will present a method for the evaluation of the charge distribution and quantum-mechanical leakage currents in ultra-thin metal-insulator-semiconductor (MIS) gate stacks that may be composed of several layers of materials. Also the charge distribution due to the finite penetration depth inside the insulating material stack is obtained.
Wim Magnus, Wim Schoenmaker
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Modeling drive currents and leakage currents: a dynamic approach
Journal of Computational Electronics, 2009The dynamics of electrons and holes propagating through the nano-scaled channels of modern semiconductor devices can be seen as a widespread manifestation of non-equilibrium statistical physics and its ruling principles. In this respect both the devices that are pushing conventional CMOS technology towards the final frontiers of Moore’s law and the ...
Magnus, Wim, Brosens, Fons, Sorée, Bart
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Low leakage current GaAs diodes
IEEE Transactions on Electron Devices, 1981Diodes were formed by Mg ion implantation into n-epitaxial GaAs layers on n+Substrates. Deep level transient spectroscopy (DLTS) measurements gave trap densities around 1012cm-3in the epilayers. The reverse-biased junction currents were in the low-to-mid 10-9A/cm2range at 10-V bias and the diodes had breakdown voltages as high as 250 V.
K.W. Loh +4 more
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2017
Leakage current can be defined as the current flowing through the ground in a lot of systems. The magnitude of the leakage current is defined based on the application and its topology. In particular, applications with transformerless topologies can be attacked by leakage current.
Kyo-Beum Lee, June-Seok Lee
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Leakage current can be defined as the current flowing through the ground in a lot of systems. The magnitude of the leakage current is defined based on the application and its topology. In particular, applications with transformerless topologies can be attacked by leakage current.
Kyo-Beum Lee, June-Seok Lee
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Leakage currents in SOI MOSFETs
IEEE Transactions on Nuclear Science, 1988Total-dose response of both NMOS and PMOS FETs fabricated on SOI substrates was studied. Two types of back-channel leakage currents were identified. A back-channel leakage due to MOSFET action uses the substrate bias as the gate bias. The other component is due to soft reverse characteristics of the body-drain junction.
N.K. Annamalai, M.C. Biwer
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Leakage Current from Appliances
IEEE Transactions on Industry Applications, 1973Leakage current from portable appliances has been limited to 0.5 mA American National Standards Institute (ANSI), Committee C101.1. Typical leakage currents are presented, and the effects of temperature, humidity, grounding, bonding, and circuit conditions on the measured values are discussed.
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