Results 241 to 250 of about 79,101 (258)

Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part II–Experimental Results and Impacts on Device Variability

IEEE Transactions on Electron Devices, 2013
Xiaobo Jiang, David Z Pan, Runsheng Wang
exaly  

Design for Variation-Immunity in Sub-10-nm Stacked-Nanowire FETs to Suppress LER-induced Random Variations

IEEE Transactions on Electron Devices, 2016
Changhwan Shin, Jinyoung Park, Hyunjae Lee   +2 more
exaly  

LER Limitations of Resist Thin Films

Journal of Photopolymer Science and Technology = [Fotoporima Konwakai Shi], 2012
Ken Maruyama, Brian Cardineau, Robert Brainard   +2 more
exaly  

Impact of Gate Line-Edge Roughness (LER) Versus Random Dopant Fluctuations (RDF) on Germanium-Source Tunnel FET Performance

IEEE Nanotechnology Magazine, 2013
Changhwan Shin, Sung Hwan Kim, Nattapol Damrongplasit   +2 more
exaly  

Biophysical Analysis of Lipopolysaccharide Formulations for an Understanding of the Low Endotoxin Recovery (LER) Phenomenon

International Journal of Molecular Sciences, 2017
Tarik A Khan, Klaus Brandenburg, Wilmar Correa   +2 more
exaly  

Vestibüler Disfonksiyon

2023
exaly  

Musa Ler

2018
openaire   +1 more source

Ara Güler's Photography of ‘Old Istanbul’ and Cosmopolitan Nostalgia

History of Photography, 2010
Ipek Tureli
exaly  

Possible mechanism for the TCRβ-chain associated EAE resistance of LER rats

Journal of Neuroscience Research, 1996
Ellen Heber-Katz, E P Blankenhorn
exaly  

Suppressed Fin-LER Induced Variability in Negative Capacitance FinFETs

IEEE Electron Device Letters, 2017
Pin Su, Ho-Pei Lee
exaly