Results 121 to 130 of about 260,963 (291)
Absolute light-scattering photometer: I. Design and operation
D. McIntyre, G.C. Doderer
openalex +1 more source
This study examines the mechanical properties of triply periodic minimal surfaces (TPMS)‐based lattices, analyzing 36 architectures in elastic and plastic regimes. It evaluates the applicability of beam‐based scaling laws to TPMS lattices. Rigidity arises from the alignment of members with the load direction and solid regions preventing rotation.
Lucía Doyle+2 more
wiley +1 more source
Static light scattering examines the scattered light intensity concerning the angular distribution of small particles that are of sub-micron size. The information on size and molecular weight of any scattering particle can be obtained easily by the ...
Sanchita Roy+2 more
doaj +1 more source
Determination of Molecular Dimensions from Light Scattering data
Anton Peterlin
openalex +1 more source
Light-scattering at Critical Opalescence [PDF]
Yves Rocard, M. A. de Ponte
openalex +1 more source
Acoustic emissions during direct laser interference patterning are shown to strongly correlate with surface texture depth. By implementing a closed‐loop control system utilizing acoustic feedback, consistent microstructures with uniform depth are achieved despite laser power fluctuations.
Tobias Steege+4 more
wiley +1 more source
Influence of anisotropy of spherulites on their light scattering (J. Polymer Sci., 20, 413–415, 1956) [PDF]
Martin Goldstein
openalex +1 more source
ALD‐Assisted VO2 for Memristor Application
This work demonstrates a strategy for depositing VOx using thermal atomic layer deposition (ALD) followed by thermal annealing to synthesize VO2. The thin film and core/shell wire memristors exhibit excellent switching performance and are highly sensitive to ambient temperature.
Jun Peng+7 more
wiley +1 more source
Calculation of the Scattering of Light from a System of Simultaneous Differential Equations [PDF]
L. S. Ornstein, F. J. M. Stratton
openalex +1 more source
This study explores aerosol jet‐printed (AJP) surface roughness, its effects on the performance of microwave electronics, and its process contributors. First, an electromagnetic model is vetted for AJP's unique roughness signature. Simulations are built which show process‐induced roughness is as significant as conductor resistivity in driving microwave
Christopher Areias, Alkim Akyurtlu
wiley +1 more source