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Solar Physics, 1984
It is shown that comparing an observed Fraunhofer profile to a fitted gaussian yields more information on shape and asymmetry of the solar line than the simple bisector method.
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It is shown that comparing an observed Fraunhofer profile to a fitted gaussian yields more information on shape and asymmetry of the solar line than the simple bisector method.
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The Interpretation of Line Profiles
International Astronomical Union Colloquium, 1977Observations of the shapes and intensities of spectral lines provide a bounty of information about the outer layers of the sun. In order to utilize this information, however, one is faced with a seemingly monumental task. The sun’s chromosphere and corona are extremely complex, and the underlying physical phenomena are far from being understood ...
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On-line guest profiling and hotel recommendation
Electronic Commerce Research and Applications, 2019Xunta de ...
Veloso, Bruno +3 more
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AAPG Bulletin, 1973
A technique developed and perfected in France by Compagnie Generale de Geophysique makes it possible to record, process, and interpret reflected events originating from every direction. The field layout is the same as that for conventional, multiple-coverage, seismic-reflection profiling. The only difference is that shot points are placed along oblique
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A technique developed and perfected in France by Compagnie Generale de Geophysique makes it possible to record, process, and interpret reflected events originating from every direction. The field layout is the same as that for conventional, multiple-coverage, seismic-reflection profiling. The only difference is that shot points are placed along oblique
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Typical weekly occupancy profiles in non-residential buildings based on mobile positioning data
Energy and Buildings, 2021Yuan Jin, Xuyuan Kang, Da Yan
exaly
Evaluation Methods of Line Profiles
2014The evaluation procedures of X-ray line profiles are overviewed in this chapter. These methods can be classified into four groups, namely (1) the most simple methods that evaluate only the breadths of diffraction peaks, (2) procedures using the Fourier-transforms of line profiles for the determination of the parameters of microstructures, (3) variance ...
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Line profiles and the kinematics of the narrow-line region
1988M. M. De Robertis, R. A. Shaw
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Spectral Line Profiles in Emitting Layers
Monthly Notices of the Royal Astronomical Society, 1962P. R. Wilson, R. G. Giovanelli
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