Results 91 to 100 of about 2,390,699 (275)

Single-shot soft x-ray laser linewidth measurement using a grating interferometer [PDF]

open access: yes, 2013
The linewidth of a 14.7 nm wavelength Ni-like Pd soft x-ray laser was measured in a single shot using a soft x-ray diffraction grating interferometer. The instrument uses the time delay introduced by the gratings across the beam to measure the temporal ...
Rocca, J. J., author   +7 more
core   +1 more source

Multidimensional and Multifunctional Laser‐Induced Graphene (LIG) for Point‐of‐Care and Wearable Biosensing, Theranostics, and Bioactive Interfaces Toward Personalized Healthcare and Regenerative Medicine

open access: yesAdvanced Science, EarlyView.
Multidimensional laser‐induced graphene (LIG) spanning from 0D to 3D architectures is comprehensively reviewed for multifunctional biomedical platforms, including biosensing, theranostics, and bioactive interface applications, which highlights its potentials for point‐of‐care diagnostics, wearable health monitoring, smart drug delivery, and tissue ...
Li Zhang   +3 more
wiley   +1 more source

Spectrum Broadening Due to Nonselective Linear Absorption

open access: yesOptics
The position and linewidth of an emission spectrum reflect the physical properties of the luminophor. So, keeping the spectrum from distortion is very important in its measurement.
Xingchu Zhang, Weilong She
doaj   +1 more source

Technique for measurement of HCN-laser linewidth

open access: yesElectronics Letters, 1969
The spectrum of the 311 and 337 μm lines of an HCN laser is examined with a high-resolution spectrum analyser. Although the outputs have spectral widths of the order of 100kHz, the spectral width of the difference frequency is less than 5kHz. The observed spectra widths are caused by mechanical instability.
openaire   +1 more source

Surface‐Spin‐Induced Magnetic Loss Enhancement in Ultralight Electromagnetic Absorbers

open access: yesAdvanced Science, EarlyView.
Fe3O4 nanoparticles with different hollow rates were synthesized to demonstrate the key role of surface moment in magnetic loss process. Using the same volume filling ratio, the 54.1% hollow Fe3O4 absorber represents about 20% enhancement in the imaginary part (μ'') than solid particles due to the coexisting magnetic resonance of inside and outside ...
Ruimin Ren   +5 more
wiley   +1 more source

Pattern‐Aware Intelligence Enables Nondestructive, Rapid Quantification of High‐Aspect‐Ratio Silicon Etching

open access: yesAdvanced Science, EarlyView.
Pattern‐dependent etching is converted into a physical prior for intelligent reconstruction of high‐aspect‐ratio silicon structures. Combining YOLO‐Pose feature extraction with a topography network, the framework retrieves depth, sidewall angle, and scallop texture from minimal destructive observations, enabling accurate cross‐scale metrology and near ...
Shuyan He   +4 more
wiley   +1 more source

Measurement of the Spectral Linewidth of Semiconductor Lasers for use with Coherent Optical Communication Systems

open access: yes, 1987
Semiconductor laser diodes with narrow linewidths (10 kHz-10 MHz) are essential for coherent fiber optical communication systems. Linewidth measurement techniques fall into three groups.
Sunak, Harish R.D., Oh, Il Whan
core   +2 more sources

Linewidth Reconstruction Employing a Radial Basis Function Network in Optical Scatterometry

open access: yesIEEE Access, 2016
This paper applied a radial basis function network (RBFN) in coherent Fourier scatterometry (CFS) to reconstruct the linewidth of periodic line/space (L/S) patterns.
Hung-Fei Kuo   +2 more
doaj   +1 more source

Millisecond Spin Relaxation Times of Distinct Electron and Hole Subensembles in MAxFA1−xPbI3 Perovskite Crystals

open access: yesAdvanced Science, EarlyView.
Mixed‐cation MAx${\rm MA}_x$ FA1−x${\rm FA}_{1-x}$ PbI3${\rm PbI}_3$ perovskite crystals reveal multiple discrete electron and hole spin subensembles associated with distinct localization environments. Optically detected magnetic resonance combined with resonant spin inertia uncovers carriers spin relaxation times reaching 2 ms and identifies nuclear ...
Rongrong Hu   +6 more
wiley   +1 more source

High Accuracy and Automatic Measurement of the Pattern Linewidth on Very Large Scale Integrated Circuits [PDF]

open access: yes, 1984
High accuracy measurement of pattern linewidth is particularly important in Very Large Scale Integrated Circuits (VLSI) manufacturing. The measurement of pattern linewidth has been done by optical methods.
Miyoshi, M.   +3 more
core   +1 more source

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