Results 241 to 249 of about 9,926 (249)
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Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope
IEEE Photonics Technology Letters, 2016Shihong Huang, Tao Zhu, Zhenzhou Cao
exaly
The impact of photoresist linewidth control and measurement
Microelectronics Reliability, 1987openaire +1 more source
Linewidth measurement: approaching the submicron dimension
Microelectronics Reliability, 1984openaire +1 more source
A rapid linewidth measurement of microwave ferrites
Proceedings of the IEEE, 1965E. Schanda, L.V.D. Kint
openaire +1 more source
NBS program in photomask linewidth measurements
Microelectronics Reliability, 1976openaire +1 more source
Linewidth measurement aids process control
Microelectronics Reliability, 1986openaire +1 more source
(GaAl)As injection laser linewidth measurements
IEEE Journal of Quantum Electronics, 1981openaire +1 more source
Laser coherence linewidth measurement based on deterioration of coherent envelope
Optics and Laser TechnologyChaoze Zhang +2 more
exaly