Results 271 to 275 of about 2,390,699 (275)
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Laser coherence linewidth measurement based on deterioration of coherent envelope

Optics and Laser Technology
Ligang Huang, Tianyi Lan, Leilei Shi
exaly  

Linewidth measurement aids process control

Microelectronics Reliability, 1986
openaire   +1 more source

Process control for submicron linewidth measurement

1994
ATON THOMAS J   +3 more
openaire   +1 more source

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