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The Measurement of Narrow Magnetic-Resonance Linewidths
IEEE Transactions on Instrumentation and Measurement, 1965A discussion is given of the origin of various errors that may occur in the measurement by cavity perturbation techniques of narrow magnetic-resonance linewidths. It is shown that the absorption by a spherical magnetic sample in a microwave cavity varies as sin2?, where ? is the angle between the static and microwave magnetic fields.
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Analysis of errors in linewidth measurements
Journal of Applied Spectroscopy, 1973Ya. F. Volkov, N. I. Mitina
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Precision measurement of transition linewidths
AIP Conference Proceedings, 1995W. A. van Wijngaarden, J. Li
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High-precision narrow laser linewidth measurement based on coherent envelope demodulation
Optical Fiber Technology, 2019Yixiong He, Shuling Hu
exaly
Exploring capabilities of electrical linewidth measurement (ELM) techniques
Microelectronic Engineering, 2001R Jonckheere
exaly
Ultra-narrow linewidth measurement based on Voigt profile fitting
Optics Express, 2015Jianfei Wang
exaly
Laser Linewidth Measurement Based on Recirculating Self-Heterodyne Method with Short Fiber
Guangxue Xuebao/Acta Optica Sinica, 2021exaly

