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Lissajous scan trajectory with internal model principle controller for fast AFM image scanning
2015 54th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE), 2015Atomic force microscopy (AFM) is a very useful measurement instrument. It can scan the conductive and nonconductive samples and without any restriction in the environments of application. Therefore, it has become an indispensable micro-/nano-scale measurement tool. However, controller of the conventional AFMs do not consider the dynamic characteristics
Jim-Wei Wu +3 more
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Uniform deposition of size-selected clusters using Lissajous scanning
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2016Size-selected clusters can be deposited on the surface using size-selected cluster ion beams. However, because of the cross-sectional intensity distribution of the ion beam, it is difficult to define the coverage of the deposited clusters. The aggregation probability of the cluster depends on coverage, whereas cluster size on the surface depends on the
Atsushi Beniya +2 more
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Motion-immune digital refocusing of point-scanning optical coherence tomography with Lissajous scan
Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XXVI, 2022Shuichi Makita +3 more
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Volumetric Lissajous scanning OR-PAM
Label-free Biomedical Imaging and Sensing (LBIS) 2025Lukas Bugyi +6 more
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Autofocus by Lissajous scanning in time reversal optical scanning holography
Chinese Optics LettersJie Liu +4 more
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Mathematical aspects in simulating Lissajous laser scanning
Digital Optical Technologies 2025Attila Csillag, Virgil-Florin Duma
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Characterization of Lissajous Scanning Trajectory Based on 2D MEMS Mirror
2023Xiulei Zhang, Yongxuan Han
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