Results 131 to 140 of about 128,875 (283)

Real‐time fault detection in multicomponent nuclear‐waste slurries through data fusion of spectroscopic sensors

AIChE Journal, EarlyView.
Abstract Three instruments–Raman spectroscopy, attenuated total reflectance–Fourier transform infrared spectroscopy, and focused beam reflectance measurement–were used to detect sensor faults, mixing faults, and unanticipated chemistry in a system of multicomponent slurries.
Steven H. Crouse, Ronald W. Rousseau, Martha A. Grover   +2 more
wiley   +1 more source

Feature Selection for Machine Learning‐Driven Accelerated Discovery and Optimization in Emerging Photovoltaics: A Review

Advanced Intelligent Discovery, EarlyView.
Feature selection combined with machine learning and high‐throughput experimentation enables efficient handling of high‐dimensional datasets in emerging photovoltaics. This approach accelerates material discovery, improves process optimization, and strengthens stability prediction, while overcoming challenges in data quality and model scalability to ...
Jiyun Zhang, Jiayi Tan, Qizhen Song, Tian Du, Jens Hauch, Christoph J. Brabec   +5 more
wiley   +1 more source

What to Make and How to Make It: Combining Machine Learning and Statistical Learning to Design New Materials

Advanced Intelligent Discovery, EarlyView.
Combining machine learning and probabilistic statistical learning is a powerful way to discover and design new materials. A variety of machine learning approaches can be used to identify promising candidates for target applications, and causal inference can help identify potential ways to make them a reality.
Jonathan Y. C. Ting, Amanda S. Barnard
wiley   +1 more source

A Novel Peak-Shape Aware Approach for Mass Alignment in Mass Spectrometry. [PDF]

Rapid Commun Mass Spectrom
Vanhemel T, Nijs M, Birmpili A, Hendriks TFE, Cuypers E, De Moor B.   +5 more
europepmc   +1 more source

Automatic Determination of Quasicrystalline Patterns from Microscopy Images

Advanced Intelligent Discovery, EarlyView.
This work introduces a user‐friendly machine learning tool to automatically extract and visualize quasicrystalline tiling patterns from atomically resolved microscopy images. It uses feature clustering, nearest‐neighbor analysis, and support vector machines. The method is broadly applicable to various quasicrystalline systems and is released as part of
Tano Kim Kender, Marco Corrias, Cesare Franchini   +2 more
wiley   +1 more source

GL-VSLAM: A General Lightweight Visual SLAM Approach for RGB-D and Stereo Cameras. [PDF]

Sensors (Basel)
Li X, Li T, Zhang Y, Li Z, Ban L, Ning Y.   +5 more
europepmc   +1 more source

Macrophage Phenotype Detection Methodology on Textured Surfaces via Nuclear Morphology Using Machine Learning

Advanced Intelligent Discovery, EarlyView.
A novel machine learning approach classifies macrophage phenotypes with up to 98% accuracy using only nuclear morphology from DAPI‐stained images. Bypassing traditional surface markers, the method proves robust even on complex textured biomaterial surfaces. It offers a simpler, faster alternative for studying macrophage behavior in various experimental
Oleh Mezhenskyi, Kateryna Andriienkova, Tetyana Goldanova, Ezgi Antmen, Thibaut Soubrie, Nihal Engin Vrana   +5 more
wiley   +1 more source

Improved WOA-DBSCAN Online Clustering Algorithm for Radar Signal Data Streams. [PDF]

Sensors (Basel)
Wan H, Lu C, Cui Y.
europepmc   +1 more source

A Machine Learning Model for Interpretable PECVD Deposition Rate Prediction

Advanced Intelligent Discovery, EarlyView.
This study develops six machine learning models (k‐nearest neighbors, support vector regression, decision tree, random forest, CatBoost, and backpropagation neural network) to predict SiNx deposition rates in plasma‐enhanced chemical vapor deposition using hybrid production and simulation data.
Yuxuan Zhai, Wenrui Wang, Rui Chen, Tong Yu, Xiaojuan Zheng, Hua Shao, Dashan Shang, Ling Li, Lado Filipovic   +8 more
wiley   +1 more source

AudioUnlock: Device-to-Device Authentication via Acoustic Signatures and One-Class Classifiers. [PDF]

Sensors (Basel)
Anistoroaei A, Iosif P, Burlacu C, Berdich A, Groza B.   +4 more
europepmc   +1 more source