Results 21 to 30 of about 472,957 (203)

Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers

open access: yesStructural Dynamics, 2016
A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron ...
D. S. Badali   +2 more
doaj   +1 more source

Is the Registry Between Adjacent Graphene Layers Grown on C-Face SiC Different Compared to That on Si-Face SiC

open access: yesCrystals, 2013
Graphene grown on C-face SiC substrates using two procedures, high and low growth temperature and different ambients, was investigated using Low Energy Electron Microscopy (LEEM), X-ray Photo Electron Electron Microscopy (XPEEM), selected area Low Energy
Chariya Virojanadara   +8 more
doaj   +1 more source

Is graphene on copper doped? [PDF]

open access: yes, 2013
Angle-resolved photoemission spectroscopy (ARPES) and X-ray photoemission spectroscopy have been used to characterise epitaxially ordered graphene grown on copper foil by low-pressure chemical vapour deposition.
Asensio, Maria-Carmen   +11 more
core   +1 more source

Fe3O4(110)-(1x3) Revisited: Periodic (111) Nano-Facets

open access: yes, 2016
The structure of the Fe3O4(110)-(1x3) surface was studied with scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and reflection high energy electron diffraction (RHEED).
Bliem, Roland   +8 more
core   +2 more sources

THE INFLUENCE OF SEGREGATION ON MORPHOLOGY OF THE (100) Cu-4 at. % Mn ALLOY SURFACE [PDF]

open access: yesФизико-химические аспекты изучения кластеров, наноструктур и наноматериалов, 2012
The influence of thermostimulated segregation on morphology of Cu-22,5 at. % Mn alloy surface was investigated by low energy electron diffraction means. Surface structural perfection of the alloy is estimated by the diffraction reflection.
K.Ch. Bzhihatlov
doaj  

Three-Fold Diffraction Symmetry in Epitaxial Graphene and the SiC Substrate

open access: yes, 2011
The crystallographic symmetries and spatial distribution of stacking domains in graphene films on SiC have been studied by low energy electron diffraction (LEED) and dark field imaging in a low energy electron microscope (LEEM). We find that the graphene
Gabaly, Farid El   +5 more
core   +1 more source

High bunch charge low-energy electron streak diffraction

open access: yesStructural Dynamics
For time-resolved diffraction studies of irreversible structural dynamics upon photoexcitation, there are constraints on the number of perturbation cycles due to thermal effects and accumulated strain, which impact the degree of crystal order and spatial
Chiwon Lee   +2 more
doaj   +1 more source

Data on the annealing of NbTiVZr at 1200 °C with slow cooling rate

open access: yesData in Brief, 2019
The data presented here is complementary to the publication entitled “High temperature, low neutron cross-section high-entropy alloys in the Nb-Ti-V-Zr system” [1]. A homogenization methodology with slower cooling rate (∼2 °C/min) was performed.
C. Parkin   +3 more
doaj   +1 more source

Si/SiGe bound-to-continuum quantum cascade emitters [PDF]

open access: yes, 2008
Si/SiGe bound-to-continuum quantum cascade emitters designed by self-consistent 6-band k.p modeling and grown by low energy plasma enhanced chemical vapour deposition are presented demonstrating electroluminescence between 1.5 and 3 THz.
Chrastina, D.   +9 more
core   +1 more source

DESORPTION OF Te CAPPING LAYER FROM ZnTe (100): AUGER SPECTROSCOPY, LOW-ENERGY ELECTRON DIFFRACTION AND SCANNING TUNNELING MICROSCOPY

open access: yesJournal of Fundamental and Applied Sciences, 2016
The influence of the annealing temperature to desorb a protective Te capping layer of the zinc telluride (ZnTe (100)) surface was investigated. The surface reconstruction of the ZnTe (100) upon the removal of a Te capping layer grown by the molecular ...
K. K. Sossoe   +6 more
doaj   +1 more source

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