Results 201 to 210 of about 2,012,876 (269)

Low-Power Short-Pulse-Width Fractional Microneedle Radiofrequency Relieves LL37-Induced Rosacea-Like Skin Inflammation. [PDF]

open access: yesJ Cosmet Dermatol
Xu Z   +11 more
europepmc   +1 more source

Comparative efficacy and safety of low-power versus high-power holmium laser enucleation of the prostate for benign prostatic hyperplasia: an updated meta-analysis. [PDF]

open access: yesAnn Med Surg (Lond)
Qazi MS   +16 more
europepmc   +1 more source

Low-Power Flexible Classifier Chip for Atrial Fibrillation Detection. [PDF]

open access: yesIEEE Trans Circuits Syst Artif Intell
Sanchez J   +4 more
europepmc   +1 more source

The impact of EEG preprocessing parameters on ultra-low-power seizure detection. [PDF]

open access: yesEpilepsia
Reisinger P   +8 more
europepmc   +1 more source

Deploying TinyML for energy-efficient object detection and communication in low-power edge AI systems. [PDF]

open access: yesSci Rep
Bhushan CM   +7 more
europepmc   +1 more source
Some of the next articles are maybe not open access.

Related searches:

Low-power divider

IEEE Transactions on Computers, 1999
The general objective of our work is to develop methods to reduce the energy consumption of arithmetic modules while maintaining the delay unchanged and keeping the increase in the area to a minimum. Here, we illustrate some techniques for dividers realized in CMOS technology.
Alberto Nannarelli, Tomás Lang
openaire   +1 more source

A low-power correlator

Proceedings of the 10th Great Lakes symposium on VLSI, 2000
The complex valued matched filter correlators consume maximum power in the DS/SS CDMA receivers. These correlators accumulate 1024 samples lying in the range -7 to +7. This accumulation needs 3 data bits, 1 sign bit and 10 extra bits for overflow. Hence, the correlator can be implemented as a cascade of 4-bit full adder and a 10-bit incrementer.
Bibhudatta Sahoo 0002   +2 more
openaire   +1 more source

Low Power Test

2008 IEEE International Test Conference, 2008
The power consumed during test mode is higher than the functional mode and becomes significantly higher for low power devices. The increased heat can result in chip burnouts and reliability issues due to electro-migration. This poster presents the reasons for higher power consumption, its consequences, and various solutions, both at hardware and ...
Swapnil Bahl   +2 more
openaire   +1 more source

Home - About - Disclaimer - Privacy