Results 201 to 210 of about 1,845,868 (327)

AFM‐Based Functional Tomography – To Mill or Not to Mill, that is the Question!

open access: yesAdvanced Materials Interfaces, EarlyView.
Complex networks of conducting domain wall interfaces exist hidden underneath the surface of ferroelectric hexagonal manganites. It reveals the morphology and conductive properties directly by 3D tomographic atomic force microscopy. It correlates the measured surface level conductance with subsurface domain wall structure, and discuss the existence ...
Niyorjyoti Sharma   +10 more
wiley   +1 more source

Temperature‐Dependent Properties of Atomic Layer Deposition‐Grown TiO2 Thin Films

open access: yesAdvanced Materials Interfaces, EarlyView.
This study explores the temperature‐dependent properties of TiO₂ thin films grown by atomic layer deposition using tetrakis dimethyl amino titanium and water. The films exhibit increased oxynitride incorporation as the process temperature increases from 150 to 350 °C, significantly influencing their optical and electrical properties. Findings highlight
Nimarta Kaur Chowdhary   +1 more
wiley   +1 more source

High‐Resolution and Surface‐Sensitive Tip‐Enhanced Raman Spectroscopy Characterization of Strained‐Silicon Devices through Cleanroom‐Compatible Plasmonic Probes

open access: yesAdvanced Materials Interfaces, EarlyView.
This paper demonstrates how Tip‐Enhanced Raman Spectroscopy (TERS) can detect diverse levels of strain in a SiGe‐Si structure in less than 20 nm of depth with lateral resolution under 100 nm. The measures are performed with a TiN‐coated probe, which secures a remarkable enhancement of the optical signal, while being chemically stable to allow TERS to ...
Chiara Mancini   +6 more
wiley   +1 more source

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