Results 151 to 160 of about 88,324,744 (172)

Interface-Driven Electrothermal Degradation in GaN-on-Diamond High Electron Mobility Transistors. [PDF]

open access: yesNanomaterials (Basel)
Wang H   +9 more
europepmc   +1 more source

Instantaneous Mean-Time-To-Failure (MTTF) estimation for checkpoint interval computation at run time

open access: yesMicroelectronics Reliability, 2019
Abstract The Mean-Time-To-Failure (MTTF) is an important parameter that determines the life-time reliability of a system. It is being used in several fault-tolerant mechanisms to take a critical decision on processor/system state. Recently it has been found that the MTTF of a system varies with the environmental conditions, in contrary to the earlier
Mohamad Imran bin Bandan   +3 more
exaly   +5 more sources
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The effect of stress on the mean time to failure (MTTF) of solder under electromigration

2015 16th International Conference on Electronic Packaging Technology (ICEPT), 2015
In this paper, we followed the advice of Prof. Tu to investigate the effect of stress on the electromigration behavior of solder. Static electromigration test and thermal cycle test (−55°C - 125°C) with maximum current density of 2×104A/cm2 were performed.
Xiaoxu Pan, Tianbao Lan, Fei Su
openaire   +3 more sources

A Method for the Calculation of the Mean Time To Failure (MTTF) of Repairable System

Advanced Materials Research, 2008
The ability of executing assigned function of repairable system under certain condition is quite different from that of single unit due to redundant configuration. It is well understood that proper management strategy can greatly prolong the mean time to failure (MTTF) of repairable system.
Jian Xin Zhu   +4 more
openaire   +3 more sources

Sharp bounds for the mean time to failure (MTTF) using partial moments

Microelectronics Reliability, 1994
Abstract In this paper, we develop bounds for the mean time to failure (MTTF) of a nonmarkovian two-unit system with repairable units when the complete information on repair time distribution is not available. We develop these bounds using the theory of Chebychev systems of functions together with the Markov-Krein theorem.
Vasanthakumar N Bhat
openaire   +3 more sources

Investigation of Mean-Time-to-Failure Measurements from AlGaN/GaN High-Electron-Mobility Transistors Using Eyring Model

open access: yesElectronics (Switzerland), 2021
We present the mean-time-to-failure (MTTF) calculations for AlGaN/GaN high-electron-mobility transistors (HEMTs) using two independent acceleration factors.
Tae-Woo Kim, Surajit Chakraborty
exaly   +2 more sources

Enhance Mean Time to Failure MTTF by Automating and Optimizing Continuous Chemical Injection in Moderate-Severe Corrosive Oil Field Well Application

SPE Middle East Artificial Lift Conference and Exhibition, 2018
Abstract The objective of this project was to install a capillary string attached to the production tubing and inject continuously corrosion inhibitor using electric chemical skid unit on the surface, controlling the doses according to the specific flow rate per well, and improve continuous rod life by extending MTTF.
Fahad Al Adi   +5 more
openaire   +1 more source

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