Results 21 to 30 of about 26,586 (117)
Integrating Optical Wireless Communication Into an Optical Bifocal Metrology for Aerospace
IEEE Photonics Journal, 2022 Recently an innovative bifocal optical metrology method was proposed for space applications (e.g., rendez-vous and docking), based on unmodulated white LEDs.
Veronica Spirito +3 more
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Metrology Challenges in 3D NAND Flash Technical Development and Manufacturing
Journal of Microelectronic Manufacturing, 2020 3D NAND technical development and manufacturing face many challenges to scale down their devices, and metrology stands out as much more difficult at each turn. Unlike planar NAND, 3D NAND has a three-dimensional vertical structure with high-aspect ratio.
Wei Zhang +4 more
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A digital framework for metrological information
Measurement: Sensors, 2021 A digital-system structure is very important for developing Metrology for Digital Transformation (M4DT) at NMIs. A plan for the digital transformation in metrology at the National Institute of Metrology (NIM), China is proposed.
XingChuang Xiong +4 more
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Metrology: where do we stumble?
Aspekti Publìčnogo Upravlìnnâ, 2019 The article presents the main milestones in the development of the science of metrology, identifies the controversial and difficult aspects of the development of this area of scientific knowledge.
Ю. П. Адлер
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Steering-enhanced quantum metrology using superpositions of noisy phase shifts
Physical Review Research, 2023 Quantum steering is an important correlation in quantum information theory. A recent work [Nat. Commun. 12, 2410 (2021)NCAOBW2041-172310.1038/s41467-021-22353-3] showed that quantum steering is also useful for quantum metrology.
Kuan-Yi Lee +5 more
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Diffraction-Based Overlay Metrology With Optical Convolution Layer
IEEE Photonics Journal, 2023 Overlay is a crucial indicator of manufacturing processing between layers. Currently, diffraction-based overlay (DBO) is widely adopted in overlay metrology.
Jinyang Li, Hung-Fei Kuo
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Review of Development of Ionizing Radiation Metrology at China Institute of Atomic Energy
Yuanzineng kexue jishuMetrology is the science of measurement and its applications, which encompasses all aspects of the theory and practice of measurement. The purpose of metrology is to ensure the consistency of units and the accuracy and reliability of measured values.
CHEN Jun, SONG Mingzhe, XU Lijun, GAO Fei, LI Wei, LUO Rui, LIU Yina, WANG Feifei, YANG Ming, JIAO Tingyu, WANG Qian
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MetrologyMetrology, the science of measurement, is an essential underpinning technology—an infratechnology. The correct functioning of the international measurement system that metrology supports is a prerequisite for the development of technology and wider ...
Richard J. C. Brown, Paul J. Brewer
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The first 75th years of manufacturing metrology at the Faculty of Mechanical engineering in Belgrade: Past / present / future [PDF]
TehnikaManufacturing metrology is the science of measurements in manufacturing engineering. It is divided into scientific, legal and applied. This paper refers to applied manufacturing metrology from the point of view of its development as an engineering ...
Majstorović Vidosav D.
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In Search of the Module in the Architectural Design of the ‘Hellenistic’ House in Nea Paphos, Cyprus
Études et Travaux (Institute des Cultures Méditerranéennes et Orientales de l'Académie Polonaise des Sciences), 2021 Ancient Graeco-Roman architecture was designed with the application of mathematical harmony as a key compositional principle used in planning the dimensions and proportions of particular elements, larger parts of buildings or whole edifices.
Aleksandra Brzozowska-Jawornicka +1 more
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