Results 41 to 50 of about 69,296 (307)

Quantum Critical Metrology [PDF]

open access: yesPhysical Review Letters, 2018
4+3 pages; 3+2 ...
Frérot, Irénée, Roscilde, Tommaso
openaire   +3 more sources

User-friendly optical metrology in production engineering

open access: yes, 2022
S.432-440In order to tap the full potential of optical metrology, a comprehensive knowledge of the measuring system properties is of particular importance.
Pfeifer, Tilo   +2 more
core   +1 more source

Integrating Optical Wireless Communication Into an Optical Bifocal Metrology for Aerospace

open access: yesIEEE Photonics Journal, 2022
Recently an innovative bifocal optical metrology method was proposed for space applications (e.g., rendez-vous and docking), based on unmodulated white LEDs.
Veronica Spirito   +3 more
doaj   +1 more source

Beyond the metrological viewpoint [PDF]

open access: yesStudies in History and Philosophy of Science Part A, 2020
The representational theory of measurement (RTM) has long been the central paradigm in the philosophy of measurement. Such is not the case anymore, partly under the influence of the critique according to which RTM offers too poor descriptions of the measurement procedures actually followed in science. This can be called the metrological critique of RTM.
openaire   +3 more sources

Reconstruction of freeform surfaces for metrology [PDF]

open access: yes, 2013
The application of freeform surfaces has increased since their complex shapes closely express a product's functional specifications and their machining is obtained with higher accuracy.
ANWER, Nabil   +10 more
core   +1 more source

Metrology Challenges in 3D NAND Flash Technical Development and Manufacturing

open access: yesJournal of Microelectronic Manufacturing, 2020
3D NAND technical development and manufacturing face many challenges to scale down their devices, and metrology stands out as much more difficult at each turn. Unlike planar NAND, 3D NAND has a three-dimensional vertical structure with high-aspect ratio.
Wei Zhang   +4 more
doaj   +1 more source

A digital framework for metrological information

open access: yesMeasurement: Sensors, 2021
A digital-system structure is very important for developing Metrology for Digital Transformation (M4DT) at NMIs. A plan for the digital transformation in metrology at the National Institute of Metrology (NIM), China is proposed.
XingChuang Xiong   +4 more
doaj   +1 more source

Experimental comparison of dynamic tracking performanceof iGPS and laser tracker [PDF]

open access: yes, 2010
External metrology systems are increasingly being integrated with traditional industrial articulated robots, especially in the aerospace industries, to improve their absolute accuracy for precision operations such as drilling, machining and jigless ...
Zheng Wang   +8 more
core   +1 more source

Metrology: where do we stumble?

open access: yesAspekti Publìčnogo Upravlìnnâ, 2019
The article presents the main milestones in the development of the science of metrology, identifies the controversial and difficult aspects of the development of this area of ​​scientific knowledge.
Ю. П. Адлер
doaj   +1 more source

Steering-enhanced quantum metrology using superpositions of noisy phase shifts

open access: yesPhysical Review Research, 2023
Quantum steering is an important correlation in quantum information theory. A recent work [Nat. Commun. 12, 2410 (2021)NCAOBW2041-172310.1038/s41467-021-22353-3] showed that quantum steering is also useful for quantum metrology.
Kuan-Yi Lee   +5 more
doaj   +1 more source

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