Results 21 to 30 of about 29,107 (261)
Metrology, 2022 Data-driven manufacturing in Industry 4.0 demands digital metrology not only to drive the in-process quality assurance of manufactured products but also to supply reliable data to constantly adjust the manufacturing process parameters for zero-defect ...
Gorka Kortaberria +3 more
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Pattern-Aware Intelligence Enables Nondestructive, Rapid Quantification of High-Aspect-Ratio Silicon Etching. [PDF]
Adv Sci (Weinh)Pattern‐dependent etching is converted into a physical prior for intelligent reconstruction of high‐aspect‐ratio silicon structures. Combining YOLO‐Pose feature extraction with a topography network, the framework retrieves depth, sidewall angle, and scallop texture from minimal destructive observations, enabling accurate cross‐scale metrology and near ...
He S, Chen L, Wen B, Jin Y, Wang W.
europepmc +2 more sources
BMC Medical Imaging, 2021 Background The commonly used NEMA IEC Body phantom has a number of defects, hindering its application for detecting micro-lesions and measuring the performance parameters of computed tomography (CT).
Shujie Lu +5 more
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Experimental critical quantum metrology with the Heisenberg scaling
npj Quantum Information, 2021 Critical quantum metrology, which exploits quantum critical systems as probes to estimate a physical parameter, has gained increasing attention recently.
Ran Liu +8 more
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In Search of the Module in the Architectural Design of the ‘Hellenistic’ House in Nea Paphos, Cyprus
Études et Travaux (Institute des Cultures Méditerranéennes et Orientales de l'Académie Polonaise des Sciences), 2021 Ancient Graeco-Roman architecture was designed with the application of mathematical harmony as a key compositional principle used in planning the dimensions and proportions of particular elements, larger parts of buildings or whole edifices.
Aleksandra Brzozowska-Jawornicka +1 more
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Metrology: where do we stumble?
Aspekti Publìčnogo Upravlìnnâ, 2019 The article presents the main milestones in the development of the science of metrology, identifies the controversial and difficult aspects of the development of this area of scientific knowledge.
Ю. П. Адлер
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Quantum Critical Metrology [PDF]
Physical Review Letters, 2018 4+3 pages; 3+2 ...
Frérot, Irénée, Roscilde, Tommaso
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Metrology Challenges in 3D NAND Flash Technical Development and Manufacturing
Journal of Microelectronic Manufacturing, 2020 3D NAND technical development and manufacturing face many challenges to scale down their devices, and metrology stands out as much more difficult at each turn. Unlike planar NAND, 3D NAND has a three-dimensional vertical structure with high-aspect ratio.
Wei Zhang +4 more
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Review of Development of Ionizing Radiation Metrology at China Institute of Atomic Energy
Yuanzineng kexue jishuMetrology is the science of measurement and its applications, which encompasses all aspects of the theory and practice of measurement. The purpose of metrology is to ensure the consistency of units and the accuracy and reliability of measured values.
CHEN Jun, SONG Mingzhe, XU Lijun, GAO Fei, LI Wei, LUO Rui, LIU Yina, WANG Feifei, YANG Ming, JIAO Tingyu, WANG Qian
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MetrologyMetrology, the science of measurement, is an essential underpinning technology—an infratechnology. The correct functioning of the international measurement system that metrology supports is a prerequisite for the development of technology and wider ...
Richard J. C. Brown, Paul J. Brewer
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