Results 41 to 50 of about 26,586 (117)
Comparison of two-color methods based on wavelength and adjacent pulse repetition interval length [PDF]
Journal of the European Optical Society-Rapid Publications, 2014 This paper describes the characteristics of a two-color method based on the adjacent pulse repetition interval length (APRIL), which functions as a length unit for femtosecond optical frequency combs (FOFCs), and compares the results to the wavelength ...
Wei D., Aketagawa M.
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Speckle reduction in double-pass retinal images using variable-focus lenses [PDF]
Journal of the European Optical Society-Rapid Publications, 2015 Speckle arises in double-pass images when coherent light is scattered by the retina. Since this noise degrades the images that are used to characterize the eye, there is special attention in reducing speckle when working with instruments based on retina ...
García-Guerra C. E. +3 more
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The Three Most Common Needs for Training on Measurement Uncertainty
Measurement Science ReviewMeasurement uncertainty is essential for assessing, stating and improving the reliability of measurements. An understanding of measurement uncertainty is the basis for confidence in measurements and is required by many communities, including national ...
Klauenberg Katy +3 more
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Quantum Metrology in the Finite-Sample Regime
PRX QuantumIn quantum metrology, a major application of quantum technologies, the ultimate precision of estimating an unknown parameter is often stated in terms of the Cramér-Rao bound.
Johannes Jakob Meyer +4 more
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Study on silicon drift detector efficiency using Monte–Carlo simulation and experimental methods
The Journal of Engineering, 2019 The energy calibration and efficiency calibration of one silicon drift detector (SDD) are introduced here. The energy calibration is achieved using four radioactive sources, and the linear correlation coefficient is close to one.
Siming Guo +7 more
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Yearbook of Swiss Administrative Sciences, 2013 Neither the Metrology Law nor the Data Protection Law currently prohibit or prevent the use of smart meters. A new issue challenging us, however, is the fact that a wide range of measuring instruments is potentially affected and that their use may be ...
Christian Bock
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An end-to-end mass spectrometry data classification model with a unified architecture
Scientific ReportsMass spectrometry, known for its high sensitivity, selectivity, rich structural information, and rapid analysis capabilities, is widely used in disease diagnosis and bioanalysis. Despite progress in classification methods/tools for data collection in the
Yinchu Wang +6 more
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Control-enhanced non-Markovian quantum metrology
Communications PhysicsQuantum metrology promises unprecedented precision of parameter estimation, but it is often vulnerable to noise. While significant efforts have been devoted to improving the metrology performance in Markovian environments, practical control schemes ...
Xiaodong Yang +8 more
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A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs
InstrumentsRecently, considerable work has been directed at the development of an ultracompact X-ray free-electron laser (UCXFEL) based on emerging techniques in high-field cryogenic acceleration, with attendant dramatic improvements in electron beam brightness and
James B. Rosenzweig +35 more
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The hidden limit in light: intrinsic noise reshaping Brillouin metrology. [PDF]
Light Sci ApplRossi L, Bolognini G.
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