Results 41 to 50 of about 226,839 (310)

Metrology Camera System of Prime Focus Spectrograph for Subaru Telescope [PDF]

, 2014
The Prime Focus Spectrograph (PFS) is a new optical/near-infrared multi-fiber spectrograph designed for the prime focus of the 8.2m Subaru telescope.
Chang, Yin-Chang, Chen, Hsin-Yo, Chou, Richard C. -Y., Gunn, James E., Hu, Yen-Sang, Huang, Pin-Jie, Karoji, Hiroshi, Karr, Jennifer, Ling, Hung-Hsu, Mao, Peter, Ohyama, Youichi, Shimono, Atsushi, Sugai, Hajime, Takato, Naruhisa, Tamura, Naoyuki, Wang, Shiang-Yu, Yan, Chi-Hung   +16 more
core   +3 more sources

Optical metrology for digital manufacturing: a review

The International Journal of Advanced Manufacturing Technology, 2022
With the increasing adoption of Industry 4.0, optical metrology has experienced a significant boom in its implementation, as an ever-increasing number of manufacturing processes are overhauled for in-process measurement and control.
S. Catalucci, A. Thompson, Samanta Piano, D. Branson, R. Leach   +4 more
semanticscholar   +1 more source

Picophotonic localization metrology beyond thermal fluctuations [PDF]

Nature Materials, 2022
Despite recent tremendous progress in optical imaging and metrology^ 1 – 6 , there remains a substantial resolution gap between atomic-scale transmission electron microscopy and optical techniques.
Tongjun Liu, Cheng Chi, J. Ou, Jie Xu, E. A. Chan, K. Macdonald, N. Zheludev   +6 more
semanticscholar   +1 more source

Microsphere-assisted, nanospot, non-destructive metrology for semiconductor devices

Light: Science & Applications, 2022
As smaller structures are being increasingly adopted in the semiconductor industry, the performance of memory and logic devices is being continuously improved with innovative 3D integration schemes as well as shrinking and stacking strategies.
Soonyang Kwon, Jang-ik Park, Kwangrak Kim, Yunje Cho, Myungjun Lee   +4 more
semanticscholar   +1 more source

Three-Dimensional Point Cloud Task-Specific Uncertainty Assessment Based on ISO 15530-3 and ISO 15530-4 Technical Specifications and Model-Based Definition Strategy

Metrology, 2022
Data-driven manufacturing in Industry 4.0 demands digital metrology not only to drive the in-process quality assurance of manufactured products but also to supply reliable data to constantly adjust the manufacturing process parameters for zero-defect ...
Gorka Kortaberria, Unai Mutilba, Sergio Gomez, Brahim Ahmed   +3 more
doaj   +1 more source

METROLOGY IN UKRAINE

Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska, 2016
The structure of Ukrainian metrology service, tasks of everyone its unit, basic stages of development and transformation of national legislation are considered on metrology tasks and harmonization of basic concepts and organizational structure of ...
Oleksandr1 Huk, Orest Ivakhiv, Bohdan Stadnyk   +2 more
doaj   +1 more source

Experimental critical quantum metrology with the Heisenberg scaling

npj Quantum Information, 2021
Critical quantum metrology, which exploits quantum critical systems as probes to estimate a physical parameter, has gained increasing attention recently.
Ran Liu, Yu Chen, Min Jiang, Xiaodong Yang, Ze Wu, Yuchen Li, Haidong Yuan, Xinhua Peng, Jiangfeng Du   +8 more
doaj   +1 more source

A NIM PET/CT phantom for evaluating the PET image quality of micro-lesions and the performance parameters of CT

BMC Medical Imaging, 2021
Background The commonly used NEMA IEC Body phantom has a number of defects, hindering its application for detecting micro-lesions and measuring the performance parameters of computed tomography (CT).
Shujie Lu, Peng Zhang, Chengwei Li, Jie Sun, Wenli Liu, Pu Zhang   +5 more
doaj   +1 more source

Integrating Optical Wireless Communication Into an Optical Bifocal Metrology for Aerospace

IEEE Photonics Journal, 2022
Recently an innovative bifocal optical metrology method was proposed for space applications (e.g., rendez-vous and docking), based on unmodulated white LEDs.
Veronica Spirito, Giulio Cossu, Fulvio Bresciani, Ernesto Ciaramella   +3 more
doaj   +1 more source

Ultrasensitive and long-range transverse displacement metrology with polarization-encoded metasurface

Science Advances, 2022
A long-range, high-precision, and compact transverse displacement metrology method is of crucial importance in many research areas. Recent schemes using optical antennas are limited in efficiency and the range of measurement due to the small size of the ...
Haofeng Zang, Z. Xi, Zhiyu Zhang, Yonghua Lu, Peibiao Wang   +4 more
semanticscholar   +1 more source