Results 51 to 60 of about 26,586 (117)

Framework for X-ray mirror surface shape fitting. [PDF]

open access: yesJ Synchrotron Radiat
Huang L   +9 more
europepmc   +1 more source

Virtualization as a New Scaling Law for Semiconductor Devices Beyond Geometric Scaling. [PDF]

open access: yesSmall
Wang Z   +8 more
europepmc   +1 more source

Critical quantum metrology robust against dissipation and nonadiabaticity. [PDF]

open access: yesSci Adv
Lü JH   +8 more
europepmc   +1 more source

Multi-Task Deep Learning for Surface Metrology. [PDF]

open access: yesSensors (Basel)
Kucharski D   +11 more
europepmc   +1 more source

Space-time superoscillations. [PDF]

open access: yesNat Commun
Shen Y, Papasimakis N, Zheludev NI.
europepmc   +1 more source

New Candidate Reference Measurement Procedures for MET CNV Detection and Quantification Using Digital PCR. [PDF]

open access: yesBiol Proced Online
Petiti J   +8 more
europepmc   +1 more source

Quantum sensing and metrology with free electrons. [PDF]

open access: yesNat Commun
Velasco CI, García de Abajo FJ.
europepmc   +1 more source

Low-Dimensional Materials for Future Transistors. [PDF]

open access: yesNanomicro Lett
Zhang S, Hong Z, Ren M, Zhu L, Wang J.
europepmc   +1 more source

Home - About - Disclaimer - Privacy