Results 51 to 60 of about 226,839 (310)
Sensors, 2022 Trends for the digital transformation of metrology and regulation of metrology through IT have some keywords in common with the main properties of the blockchain, such as traceability, immutability, and machine-readable documents.
Kruno Miličević +3 more
doaj +1 more source
Metrology Challenges in 3D NAND Flash Technical Development and Manufacturing
Journal of Microelectronic Manufacturing, 2020 3D NAND technical development and manufacturing face many challenges to scale down their devices, and metrology stands out as much more difficult at each turn. Unlike planar NAND, 3D NAND has a three-dimensional vertical structure with high-aspect ratio.
Wei Zhang +4 more
doaj +1 more source
A digital framework for metrological information
Measurement: Sensors, 2021 A digital-system structure is very important for developing Metrology for Digital Transformation (M4DT) at NMIs. A plan for the digital transformation in metrology at the National Institute of Metrology (NIM), China is proposed.
XingChuang Xiong +4 more
doaj +1 more source
Quantum Metrology with Cold Atoms
, 2013 Quantum metrology is the science that aims to achieve precision measurements by making use of quantum principles. Attribute to the well-developed techniques of manipulating and detecting cold atoms, cold atomic systems provide an excellent platform for ...
Huang, Jiahao +3 more
core +1 more source
Metrology: where do we stumble?
Aspekti Publìčnogo Upravlìnnâ, 2019 The article presents the main milestones in the development of the science of metrology, identifies the controversial and difficult aspects of the development of this area of scientific knowledge.
Ю. П. Адлер
doaj +1 more source
Diffraction-Based Overlay Metrology With Optical Convolution Layer
IEEE Photonics Journal, 2023 Overlay is a crucial indicator of manufacturing processing between layers. Currently, diffraction-based overlay (DBO) is widely adopted in overlay metrology.
Jinyang Li, Hung-Fei Kuo
doaj +1 more source
A low cost scheme for high precision dual-wavelength laser metrology
, 2013 A novel method capable of delivering relative optical path length metrology with nanometer precision is demonstrated. Unlike conventional dual-wavelength metrology which employs heterodyne detection, the method developed in this work utilizes direct ...
Ireland, Michael J. +5 more
core +1 more source
Review of the mathematical foundations of data fusion techniques in surface metrology [PDF]
, 2015 The recent proliferation of engineered surfaces, including freeform and structured surfaces, is challenging current metrology techniques. Measurement using multiple sensors has been proposed to achieve enhanced benefits, mainly in terms of spatial ...
Ai C +34 more
core +1 more source
Investigation in optimisation of accuracy with non-contact systems by influencing variable processes [PDF]
, 2019 The use of 3D scanning systems is becoming increasingly popular and an essential tool for manufacturers for inspection and measurement. With such systems being utilised on the manufacturing shop floor due to their portability and ease of use, it is no ...
Gashi, Bekim V. +3 more
core +1 more source
The GRAVITY metrology system: modeling a metrology in optical fibers
, 2014 GRAVITY is the second generation VLT Interferometer (VLTI) instrument for high-precision narrow-angle astrometry and phase-referenced interferometric imaging.
Amorim, A. +22 more
core +1 more source