Results 51 to 60 of about 26,586 (117)
Framework for X-ray mirror surface shape fitting. [PDF]
Huang L +9 more
europepmc +1 more source
Virtualization as a New Scaling Law for Semiconductor Devices Beyond Geometric Scaling. [PDF]
Wang Z +8 more
europepmc +1 more source
Critical quantum metrology robust against dissipation and nonadiabaticity. [PDF]
Lü JH +8 more
europepmc +1 more source
Advancing service offerings in food and nutrition metrology: the updated METROFOOD-RI service chart. [PDF]
De Bruyn C +3 more
europepmc +1 more source
Multi-Task Deep Learning for Surface Metrology. [PDF]
Kucharski D +11 more
europepmc +1 more source
Influence of Multi-Cue Interaction on Human Depth Perception in Three-Dimensional Space. [PDF]
Liu Q +5 more
europepmc +1 more source
Space-time superoscillations. [PDF]
Shen Y, Papasimakis N, Zheludev NI.
europepmc +1 more source
New Candidate Reference Measurement Procedures for MET CNV Detection and Quantification Using Digital PCR. [PDF]
Petiti J +8 more
europepmc +1 more source
Quantum sensing and metrology with free electrons. [PDF]
Velasco CI, García de Abajo FJ.
europepmc +1 more source
Low-Dimensional Materials for Future Transistors. [PDF]
Zhang S, Hong Z, Ren M, Zhu L, Wang J.
europepmc +1 more source

