Results 71 to 80 of about 226,839 (310)

Synchrotron Radiation for Quantum Technology

Advanced Functional Materials, EarlyView.
Materials and interfaces underpin quantum technologies, with synchrotron and FEL methods key to understanding and optimizing them. Advances span superconducting and semiconducting qubits, 2D materials, and topological systems, where strain, defects, and interfaces govern performance.
Oliver Rader, Sakura Pascarelli, Klaus Attenkofer, Anna A. Makarova, Karsten Holldack, Kai Rossnagel, Kristiaan Temst, George Kourousias, Stefano Carretta, Caterina Biscari, Helmut Dosch   +10 more
wiley   +1 more source

Qubit metrology and decoherence [PDF]

, 2007
Quantum properties of the probes used to estimate a classical parameter can be used to attain accuracies that beat the standard quantum limit. When qubits are used to construct a quantum probe, it is known that initializing $n$ qubits in an entangled ...
A. S. Holevo, Anil Shaji, C. W. Helstrom, Carlton M. Caves, D. M. Greenberger, E. B. Davies, H. Cramer, H. P. Breuer, K. Kraus, M. A. Nielsen, M. Revzen, S. L. Braunstein, S. L. Braunstein   +12 more
core   +1 more source

Digital twins for metrology; metrology for digital twins

Measurement science and technology
Digital twinning is a rapidly growing area of research. Digital twins combine models and data to provide up-to-date information about the state of a system.
Louise Wright, Stuart Davidson
semanticscholar   +1 more source

Continuous‐Flow Photocatalytic Degradation of Glyphosate and Aminomethylphosphonic Acid Under Simulated Sunlight with TiO2‐Coated Poly(vinylidene fluoride) Membrane

Advanced Functional Materials, EarlyView.
Glyphosate (GLY) and its primary metabolite, aminomethylphosphonic acid (AMPA), are photodegraded using a poly(vinylidene fluoride) membrane with immobilized titanium dioxide (PVDF‐TiO2) in a continuous flow‐through operation under solar light. At optimized conditions, the PVDF‐TiO2 membrane achieved 95% GLY and 80% AMPA removal with •O2− as the ...
Phuong B. Trinh, Siqi Liu, Nurul F. Himma, Béla Fiser, Andrea I. Schäfer   +4 more
wiley   +1 more source

A brief history of metrology: past, present, and future

International Journal of Metrology and Quality Engineering, 2019
In this paper, we take the freedom to paraphrase Stephen Hawking's well-known formula and approach, for a reflection about metrology. In fact, metrology has a past, a present, and a future. The past is marked by a rich series of events, of which we shall
Fanton Jean-Pierre
doaj   +1 more source

Quantum-Dense Metrology

, 2012
Quantum metrology utilizes entanglement for improving the sensitivity of measurements. Up to now the focus has been on the measurement of just one out of two non-commuting observables.
A Abramovici, A Einstein, A Furusawa, B Lücke, B Sathyaprakash, C Gross, C Silberhorn, CH Bennett, D Leibfried, DJ Ottaway, E Arthurs, GM D'Ariano, H Vahlbruch, Helge Müller-Ebhardt, HJ Kimble, I Afek, J Abadie, J Rarity, J-Y Vinet, Jöran Bauchrowitz, Karsten Danzmann, M Mitchell, M Tsang, Melanie Meinders, P Cappellaro, R Schnabel, Roman Schnabel, S Steinlechner, Sebastian Steinlechner, SL Braunstein, U Leonhardt, V Giovannetti, V Giovannetti, W Wasilewski, WP Bowen, ZY Ou   +35 more
core   +2 more sources

ASTRA: ASTrometry and phase-Referencing Astronomy on the Keck interferometer [PDF]

, 2010
ASTRA (ASTrometric and phase-Referencing Astronomy) is an upgrade to the existing Keck Interferometer which aims at providing new self-phase referencing (high spectral resolution observation of YSOs), dual-field phase referencing (sensitive AGN ...
Akeson, R., Appleby, E., Berkey, B., Colavita, M., Cooper, A., Eisner, J., Felizardo, C., Ghez, A., Graham, J., Herstein, J., Hillenbrand, L., Hrynevych, M., Martin, O., Medeiros, D., Millan-Gabet, R., Monnier, J., Morrison, D., Panteleeva, T., Pott, J. -U., Ragland, S., Smith, B., Summers, K., Tsubota, K., Tyau, C., Wetherell, E., Wizinowich, P., Woillez, J.   +26 more
core   +3 more sources

THE ROLE OF PRECISION METROLOGY IN ENHANCING MANUFACTURING QUALITY: A COMPREHENSIVE REVIEW

Engineering Science & Technology Journal
Precision metrology plays a pivotal role in modern manufacturing processes by ensuring the attainment of high-quality standards and the optimization of production efficiency.
Kehinde Andrew Olu-lawal, Oladiran Kayode Olajiga, Emmanuel Chigozie Ani, Adeniyi Kehinde Adeleke, Danny Jose Portillo Montero   +4 more
semanticscholar   +1 more source

Solvent‐Free Bonding Mechanisms and Microstructure Engineering in Dry Electrode Technology for Lithium‐Ion Batteries

Advanced Functional Materials, EarlyView.
Dry electrode technology revolutionizes battery manufacturing by eliminating toxic solvents and energy‐intensive drying. This work details two promising techniques: dry spray deposition and polymer fibrillation. How their unique solvent‐free bonding mechanisms create uniform microstructures for thicker, denser electrodes, boosting energy density and ...
Yuhao Liang, Hao Long, Zimo Huang, Ting He, Xueming Chen, Meng Li, Hao Chen, Shanqing Zhang   +7 more
wiley   +1 more source

Nano-precision metrology of X-ray mirrors with laser speckle angular measurement

Light: Science & Applications, 2021
A versatile high precision metrology instrument has been developed that surpass the limits of existing metrology techniques and opens up new possibilities to develop next-generation super-polished X-ray mirrors.
Hongchang Wang, Simone Moriconi, Kawal Sawhney   +2 more
doaj   +1 more source