Results 81 to 90 of about 69,296 (307)

Tailoring Phonon‐Driven Responses in α‐MoO3 through Isotopic Enrichment

Advanced Materials, EarlyView.
ABSTRACT The implementation of polaritonic materials into nanoscale devices requires selective tuning of parameters to realize desired spectral or thermal responses. One robust material, α‐MoO3, an orthorhombic crystal boasting three distinct phonon dispersions, provides three polaritonic dispersions of hyperbolic phonon polaritons (HPhPs) across the ...
Thiago S. Arnaud, Ryan W. Spangler, Johnathan D. Georgaras, Jonah B. Haber, Daniel Hirt, Maximilian Obst, Gonzalo Álvarez‐Pérez, Mackey Long III, Felix G. Kaps, Jakob Wetzel, Courtney Ragle, John E. Buchner, Youngji Kim, Aditha S. Senarath, Richarda Niemann, Mingze He, Giulia Carini, Unai Arregui‐Leon, Akash C. Behera, Ramachandra Bangari, Nihar Sahoo, Niels C. Brumby, J. Michael Klopf, Martin Wolf, Lukas M. Eng, Susanne C. Kehr, Thomas G. Folland, Alexander Paarmann, Patrick E. Hopkins, Felipe Jornada, Jon‐Paul Maria, Joshua D. Caldwell   +31 more
wiley   +1 more source

2D Super‐Resolution Metrology Based on Superoscillatory Light

Advanced Science
Progress in the semiconductor industry relies on the development of increasingly compact devices consisting of complex geometries made from diverse materials.
Yu Wang, Eng Aik Chan, Carolina Rendón‐Barraza, Yijie Shen, Eric Plum, Jun‐Yu Ou   +5 more
doaj   +1 more source

Eurachem—A Focus for Analytical Chemistry in Europe

Proceedings, 2020
Established in 1989, the aim of Eurachem is to provide a focus for analytical chemistry and [...]
Vicki J Barwick
doaj   +1 more source

An alternative approach to the tomographic reconstruction of smooth refractive index distributions [PDF]

Journal of the European Optical Society-Rapid Publications, 2013
Continuous, mathematically smooth Phase Objects with radial symmetry are reconstructed from cross sections of their refractive index distribution by a novel method, consisting of a linear combination of Gaussian basis functions, whose technical details ...
de la Rosa-Miranda E., Berriel-Valdos L. R., Gonzalez-Ramirez E., Alaniz-Lumbreras D., Saucedo-Anaya T., de la Rosa-Vargas J. I., Villa-Hernández J. J., Torres-Argüelles V., Castaño V. M.   +8 more
doaj   +1 more source

Full Vectorial Field Sensing Using Liquid Crystal Droplet Arrays

Advanced Materials, EarlyView.
An inkjet‐printed liquid crystal droplet array enables compact, low‐cost, single‐shot sensing of the full vectorial light field. Within a single platform, it simultaneously retrieves intensity, polarization, and phase, while dual‐wavelength operation highlights its capability for multi‐wavelength optical field characterization. ABSTRACT Determining the
Xuke Qiu, Jinge Guo, Jiahe Cui, Runchen Zhang, Zimo Zhao, Yifei Ma, Waqas Kamal, Steve J. Elston, Alfonso A. Castrejón‐pita, Stephen M. Morris, Chao He   +10 more
wiley   +1 more source

Comparison of two-color methods based on wavelength and adjacent pulse repetition interval length [PDF]

Journal of the European Optical Society-Rapid Publications, 2014
This paper describes the characteristics of a two-color method based on the adjacent pulse repetition interval length (APRIL), which functions as a length unit for femtosecond optical frequency combs (FOFCs), and compares the results to the wavelength ...
Wei D., Aketagawa M.
doaj   +1 more source

Towards Metrology 4.0 in dimensional measurements

, 2023
The paper presents the transformations taking place in length and angle metrology related to Metrology 4.0, a measurement strategy resulting from Industry 4.0.
Justyna Trojanowska, Wieczorowski, Michal, Michal Wieczorowski, Trojanowska, Justyna   +3 more
core   +1 more source

Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging

Advanced Materials Interfaces, EarlyView.
This study establishes a dual‐channel optical metrology framework integrating phase‐shifting imaging ellipsometry and deep‐UV reflectance imaging. This label‐free approach enables simultaneous, time‐resolved mapping of film thickness and nanoparticle (NP) concentration in dynamic nanofluid thin films.
Eita Shoji, Keita Aizawa, Hiroki Kusudo, Tetsushi Biwa   +3 more
wiley   +1 more source

A Smart Metrology Laboratory Environmental Monitoring and Recognition Method Based on Digital Twin and Improved Transformer

The Journal of Engineering
Aiming at the problems of poor reliability and low visualization in the monitoring of power metrology laboratories, a smart power metrology laboratory environmental monitoring and recognition method based on digital twins and improved Transformer is ...
Zuo Wang, Cuiying Kai, Qi Li, Huiying Liu   +3 more
doaj   +1 more source

Speckle reduction in double-pass retinal images using variable-focus lenses [PDF]

Journal of the European Optical Society-Rapid Publications, 2015
Speckle arises in double-pass images when coherent light is scattered by the retina. Since this noise degrades the images that are used to characterize the eye, there is special attention in reducing speckle when working with instruments based on retina ...
García-Guerra C. E., Aldaba M., Arjona M., Pujol J.   +3 more
doaj   +1 more source