Results 21 to 30 of about 388,981 (285)
Polynomial force approximations and multifrequency atomic force microscopy
We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip–surface force during a slow surface approach and compare the results with amplitude-dependence force spectroscopy (ADFS ...
Daniel Platz +3 more
doaj +1 more source
Piezoresistive sensors for atomic force microscopy
An important element in microelectronics is the comparison of the modelling and measurements results of the real semiconductor devices. Our paper describes the final results of numerical simulation of a micromechanical process sequence of the atomic ...
Tomasz Dębski +6 more
doaj +1 more source
Combined Traction Force–Atomic Force Microscopy Measurements of Neuronal Cells
In the course of the development of the nervous system, neuronal cells extend (grow) axons, which navigate over distances of the order of many cell diameters to reach target dendrites from other neurons and establish neuronal circuits.
Udathari Kumarasinghe +2 more
doaj +1 more source
Device for in-situ cleaving of hard crystals [PDF]
Cleaving crystals in a vacuum chamber is a simple method for obtaining atomically flat and clean surfaces for materials that have a preferential cleaving plane.
A. Renner +4 more
core +2 more sources
The basic principles of atomic force microscopy are discussed. Various deflection sensors are described and compared with each other. A simple theoretical basis of the fundamental forces, such as van der Waals, electrostatic, magnetic, capillary, ionic repulsion and frictional forces, is given and the relevant experimental work is summarized.
openaire +2 more sources
Atomic Force Microscopy of height fluctuations of fibroblast cells [PDF]
We investigated the nanometer scale height fluctuations of 3T3 fibroblast cells with the atomic force microscope (AFM) under physiological conditions. Correlation between these fluctuations and lateral cellular motility can be observed.
A. Czirók +31 more
core +2 more sources
Profilometry and atomic force microscopy for surface characterization
: Aim: This study aims to evaluate and compare the profilometry and atomic force microscopy (AFM) for characterization of biomaterial surfaces. Method: The clinically commonly used titanium (Ti) was used as the specimen. Each of the specimen was prepared
Li Mei, Guangzhao Guan
doaj +1 more source
Crosstalk Correction in Atomic Force Microscopy
Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately.
E. Soergel +4 more
core +1 more source
Structure of self-assembled Mn atom chains on Si(001) [PDF]
Mn has been found to self-assemble into atomic chains running perpendicular to the surface dimer reconstruction on Si(001). They differ from other atomic chains by a striking asymmetric appearance in filled state scanning tunneling microscopy (STM ...
Bowler, D. +5 more
core +3 more sources
Clay surface characteristics using atomic force microscopy
El primer componente para la fabricación de productos de mampostería para la construcción es la arcilla, la cual aporta la plasticidad que facilita el moldeo y el manejo del producto. El segundo componente es el feldespato en su formación como alúmina (
Ricardo Andrés García-León +2 more
doaj +3 more sources

