Results 271 to 280 of about 2,274,021 (321)
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High-resolution scanning electron microscopy

Ultramicroscopy, 1991
The scanning electron microscope (SEM) builds up an image by sampling contiguous sub-volumes near the surface of the specimen. A fine electron beam selectively excites each sub-volume and then the intensity of some resulting signal is measured. The spatial resolution of images made using such a process is limited by at least three factors. Two of these
D C, Joy, J B, Pawley
openaire   +2 more sources

Machine learning in scanning transmission electron microscopy

Nature Reviews Methods Primers, 2022
Sergei V. Kalinin   +15 more
semanticscholar   +2 more sources

Volume Scanning Electron Microscopy: Serial Block-Face Scanning Electron Microscopy Focussed Ion Beam Scanning Electron Microscopy

2017
Volume scanning electron microscopy is renewing interest in electron microscopy by offering three dimensional visualisation of biological systems. Two main contributors to this are the Serial Block-Face SEM (SBEM) and Focused Ion Beam SEM (FIB-SEM).
Richard I. Webb, Nicole L. Schieber
openaire   +1 more source

Scanning Electron Microscopy

1994
Since the appearance of the first commercial scanning electron microscope (SEM) three decades ago, major advances were achieved in resolution, new electron probe sources, the development of additional modes, and computerization (including built-in image store capabilities in the current generation of instruments).
B. G. Yacobi, D. B. Holt
openaire   +1 more source

Scanning Electron Microscopy

International Ophthalmology Clinics, 1973
M G, Wickham, D M, Worthen
openaire   +2 more sources

Scanning Electron Microscopy

2003
Scanning electron microscopy (SEM) has a history almost as old as TEM, but the development of a commercial product took much longer. (1938) built the first SEM, and (1942) produced an SEM with a 50-nm probe. A group in Cambridge, England headed by Oatley began work in 1948 that led to the first commercial SEM (the Cambridge Stereoscan) in 1965.
Michael J. Dykstra, Laura E. Reuss
openaire   +1 more source

Scanning electron microscopy

Uspekhi Fizicheskih Nauk, 1969
G V Spivak, G V Saparin, M V Bykov
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Scanning Electron Microscopy

1975
The scanning electron microscope (sem) is an instrument designed primarily for studying the surfaces of solids at high magnification. In this respect it may be compared with the optical microscope, and a set of micrographs taken on each instrument is shown in figure 2.1.
D. K. Bowen, C. R. Hall
openaire   +1 more source

Whole-cell organelle segmentation in volume electron microscopy

Nature, 2021
Larissa Heinrich   +20 more
semanticscholar   +1 more source

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