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Nanoscale geometrical patterning for junctionless thermoelectrics
Gonzalez-Munoz S +12 more
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Analytical Chemistry, 2004
Scanning probe microscopes (SPMs) generate a highly-resolved image of the specimen by scanning its surface with a tiny mechanical, electrical, optical, thermal, or other probe. Often the tip radius of the probe is only a few nm or less. Examples for SPMs are the atomic force microscope (AFM; Sect.
Mark A, Poggi +5 more
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Scanning probe microscopes (SPMs) generate a highly-resolved image of the specimen by scanning its surface with a tiny mechanical, electrical, optical, thermal, or other probe. Often the tip radius of the probe is only a few nm or less. Examples for SPMs are the atomic force microscope (AFM; Sect.
Mark A, Poggi +5 more
+8 more sources
Current Opinion in Chemical Biology, 1997
During the past year, scanning probe microscopy, especially atomic force microscopy (AFM), has taken root in the biological sciences community, as is evident from the large number of publications and from the variety of specialized journals in which these papers appear.
R J, Colton +4 more
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During the past year, scanning probe microscopy, especially atomic force microscopy (AFM), has taken root in the biological sciences community, as is evident from the large number of publications and from the variety of specialized journals in which these papers appear.
R J, Colton +4 more
openaire +4 more sources
Analytical Chemistry, 1994
The literature concerning scanning tunneling microscopy (STM) and atomic force microscopy (AFM) continues to grow. This review will cover the literature published since the last review of this kind and include the time period from December 1991 to December 1993 (AI).
D R, Louder, B A, Parkinson
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The literature concerning scanning tunneling microscopy (STM) and atomic force microscopy (AFM) continues to grow. This review will cover the literature published since the last review of this kind and include the time period from December 1991 to December 1993 (AI).
D R, Louder, B A, Parkinson
openaire +2 more sources
Japanese Journal of Applied Physics, 2020
Presentation slides on Scanning Probe ...
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Presentation slides on Scanning Probe ...
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Engineering Science and Education Journal, 1992
The article describes a range of microscopy techniques which are based on scanning a sharp tip over a surface. With such techniques it is possible both to image surfaces to atomic resolution, and to perform local property measurements to a resolution determined by the nature of the tip–surface interaction.
M.E. Welland +3 more
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The article describes a range of microscopy techniques which are based on scanning a sharp tip over a surface. With such techniques it is possible both to image surfaces to atomic resolution, and to perform local property measurements to a resolution determined by the nature of the tip–surface interaction.
M.E. Welland +3 more
openaire +1 more source

