Results 1 to 10 of about 15,945 (255)

Minimum aberration designs of resolution III

open access: yes, 2002
In this article we prove several important properties of 2^{k-p} minimum aberration (MA) designs with k>2, where n=2^{k-p} is the number of runs. We develop a simple method to build MA designs of resolution III. Furthermore, we introduce a simple relationship, based on product of polynomials, for computing their word-length patterns.
Juan, Jesus, Palomo, J. Gabriel
openaire   +2 more sources

Materials News: Interfacial chemistry and atomic arrangement of ZrO2 − La2/3Sr1/3MnO3 pillar-matrix structures

open access: yesAPL Materials, 2014
We studied ZrO2 − La2/3Sr1/3MnO3 pillar–matrix thin films which were found to show anomalous magnetic and electron transport properties. With the application of an aberration-corrected transmission electron microscope, interfacial chemistry, and atomic ...
Dan Zhou   +6 more
doaj   +1 more source

CYTOLOGICAL STUDIES OF THE MEIOSIS BEHAVIOUR DIVISION OF (DATURA, ERUCA AND CARDUUS) PLANTS IN HABANIA LAKE OF ANBAR [PDF]

open access: yesمجلة جامعة الانبار للعلوم الصرفة, 2012
During the study of the behavior of meiosis in 5 anthers in each species of (Datura inoxia(Solanaceae),Eruca sativa(Cruciferae)andCarduus pycnocephalus(Compositae) around the area of Habania leak, Datura plant revealed a moderate number of cells between (
NAJI SWADI NASSER, ENAS ADNIN MANFY
doaj   +1 more source

An easy to construct sub-micron resolution imaging system

open access: yesScientific Reports, 2020
We report an easy to construct imaging system that can resolve particles separated by $$\ge $$ ≥ 0.68 $$\upmu $$ μ m with minimum aberrations. Its first photon collecting lens is placed at a distance of 31.6 mm giving wide optical access.
Lakhi Sharma, A. Roy, S. Panja, S. De
doaj   +1 more source

Bio-Inspired Wide-Angle Broad-Spectrum Cylindrical Lens Based on Reflections from Micro-Mirror Array on a Cylindrical Elastomeric Membrane

open access: yesMicromachines, 2014
We present a wide-angle, broad-spectrum cylindrical lens based on reflections from an array of three-dimensional, high-aspect-ratio micro-mirrors fabricated on a cylindrical elastomeric substrate, functionally inspired by natural reflecting superposition
Chi-Chieh Huang, Hongrui Jiang
doaj   +1 more source

Error correction of a phase-only computer-generated hologram for an aspheric surface [PDF]

open access: yesJournal of the European Optical Society-Rapid Publications, 2014
When applying phase-only computer-generated hologram (CGH) as a standard model of optical measurement in computer-generated holography for aspheric surface testing, it has the advantage of simplifying optical path configuration and improving the ...
Zhang H.   +5 more
doaj   +1 more source

Zernike Polynomiales· for Opticl Ssytew. With Borizantal Recta_nguJar Aperture

open access: yesIbn Al-Haitham Journal for Pure and Applied Sciences, 2017
For  small   aberrations,  the  Â·suehl'  ratio of  an . im i'ng syStem • depends on trne aberration v·ariance. Its· aberration fu.nct1on ·is e:qJanded in terms 9f-l nike polynomials. which are_ oirrh6goilal over a circular apeltitte.
A, ,1J. AL-.llamdani, 8 Y. RAI-As di
doaj  

Designing the optimal Fresnel lenses by using Zemax software [PDF]

open access: yesJournal of Optoelectronical Nanostructures, 2018
In this paper, the optimal Fresnel lenses are designed by Zemax software.The fundamental problem of the Fresnel lenses is the beam divergence, which wasresolved by decreeing the output stain diameter on the image plane.
Alireza Keshavarz   +1 more
doaj  

An Aliasing Measure of Factor Effects in Three-Level Regular Designs

open access: yesEntropy
For three-level regular designs, the confounding from the perspectives of both factor and component effects leads to different results. The aliasing properties of factor effects are more significant than the latter in the experimental model.
Qiuying Chen, Zhiming Li, Zhi Li
doaj   +1 more source

A Photolithography Process Design for 5 nm Logic Process Flow

open access: yesJournal of Microelectronic Manufacturing, 2019
With the introduction of EUV lithography, the photolithographic process in 5 nm logic process can be simplified to use mostly single exposure method. In a typical 5 nm logic process, the contact-poly pitch (CPP) is 44-50 nm, the minimum metal pitch (MPP)
Qiang Wu   +3 more
doaj   +1 more source

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