Results 11 to 20 of about 3,356 (188)
Analysis of photoelastic properties of monocrystalline silicon [PDF]
Journal of Sensors and Sensor Systems, 2020 Abstract. Photoelasticity is considered a useful measurement tool for the non-destructive and contactless determination of mechanical stresses or strains in the production of silicon wafers. It describes a change in the indices of refraction of a material when the material is mechanically loaded.
M. Stoehr +3 more
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Node-Loss Detection Methods for CZ Silicon Single Crystal Based on Multimodal Data Fusion
Sensors, 2023 Monocrystalline silicon is an important raw material in the semiconductor and photovoltaic industries. In the Czochralski (CZ) method of growing monocrystalline silicon, various factors may cause node loss and lead to the failure of crystal growth ...
Lei Jiang, Rui Xue, Ding Liu
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Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning
Journal of Telecommunications and Information Technology, 2022 Defect detection is an important step in industrial production of monocrystalline silicon. Through the study of deep learning, this work proposes a framework for classifying monocrystalline silicon wafer defects using deep transfer learning (DTL).
Adriana Ganum +3 more
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Фізика і хімія твердого тіла, 2022 In this work, to calculate the distribution of the excess minority carrier concentration in bilateral macroporous silicon, the solution of the diffusion equation for stationary conditions is used, which is written for a monocrystalline substrate and ...
V.F. Onyshchenko
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The CNN Deep Learning-Based Melting Process Prediction of Czochralski Monocrystalline Silicon
IEEE Access, 2022 To solve seeding failures due to the misjudgment caused by manual observation in the traditional melting process of Czochralski (CZ) monocrystalline silicon, a method for predicting the melting progress of CZ monocrystalline silicon based on ...
Jing Zhang, Ding Liu, Qin-Wei Tang
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IEEE Access, 2023 In this article, the effect of local mechanical stress on the properties of monocrystalline and polycrystalline silicon-based p-n junctions under illumination is studied and analyzed experimentally and theoretically.
Jasurbek Gulomov +4 more
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Effective minority carrier lifetime in double-sided macroporous silicon
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2020 In this paper, we showed that the effective lifetime of minority charge carriers in double-sided macroporous silicon is determined from a system of two transcendental equations.
V.F. Onyshchenko, L.A. Karachevtseva
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Communications Materials, 2023 Silicon has attracted considerable attention for use as high-capacity anodes of lithium-ion microbatteries. However, its extreme volume change upon (de-)lithiation still poses a challenge for adoption as it leads to severe active lithium loss that ...
Andam Deatama Refino +13 more
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Study of the Brittle Fracture of Monocrystalline Silicon Wafers [PDF]
Civil-Comp Proceedings, 2009 There is a growing trend towards using thinner wafers in order to reduce the costs of solar energy. But the current tools employed during the solar cells production are not prepared to work with thinner wafers, decreasing the industrial yield due to the high number of wafers broken.
Barredo Egusquiza, Josu +2 more
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Lamb wave propagation in monocrystalline silicon wafers [PDF]
The Journal of the Acoustical Society of America, 2018 Monocrystalline silicon wafers are widely used in the photovoltaic industry for solar panels with high conversion efficiency. Guided ultrasonic waves offer the potential to efficiently detect micro-cracks in the thin wafers. Previous studies of ultrasonic wave propagation in silicon focused on effects of material anisotropy on bulk ultrasonic waves ...
Fromme, P +3 more
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