Results 201 to 210 of about 831,537 (291)
Uncertainty‐Guided Selective Adaptation Enables Cross‐Platform Predictive Fluorescence Microscopy
Advanced Intelligent Discovery, EarlyView.Deep learning models often fail when transferred to new microscopes. A novel framework overcomes this by selectively adapting the early layers governing low‐level image statistics, while freezing deep layers that encode morphology. This uncertainty‐guided approach enables robust, label‐free virtual staining across diverse systems, democratizing ...
Kai‐Wen K. Yang +9 more
wiley +1 more source
Enhanced Monte Carlo Methods for Modeling Proteins Including Computation of Absolute Free Energies of Binding. [PDF]
J Chem Theory Comput, 2018 Cabeza de Vaca I +4 more
europepmc +1 more source
Advanced Intelligent Discovery, EarlyView.Materials informatics and autonomous experimentation are transforming the discovery of organic molecular crystals. This review presents an integrated molecule–crystal–function–optimization workflow combining machine learning, crystal structure prediction, and Bayesian optimization with robotic platforms.
Takuya Taniguchi +2 more
wiley +1 more source
Predicting Performance of Hall Effect Ion Source Using Machine Learning
Advanced Intelligent Systems, Volume 7, Issue 3, March 2025.This study introduces HallNN, a machine learning tool for predicting Hall effect ion source performance using a neural network ensemble trained on data generated from numerical simulations. HallNN provides faster and more accurate predictions than numerical methods and traditional scaling laws, making it valuable for designing and optimizing Hall ...
Jaehong Park +8 more
wiley +1 more source
Multicomponent adsorption in mesoporous flexible materials with flat-histogram Monte Carlo methods. [PDF]
J Chem Phys, 2016 Mahynski NA, Shen VK.
europepmc +1 more source
Advanced Intelligent Systems, EarlyView.A volatile‐switching compact model of electrochemical metallization memory cells for neuromorphic architecture is developed and validated by reliable reproduction of device characterization measurements: I−V sweeps, SET kinetics, relaxation dynamics.
Rana Walied Ahmad +4 more
wiley +1 more source
Machine Learning‐Driven Variability Analysis of Process Parameters for Semiconductor Manufacturing
Advanced Intelligent Systems, EarlyView.This research presents a machine learning approach that integrates nonlinear variation decomposition (NLVD) with statistical techniques to quantify the contribution of individual unit processes to performance and variance of figure of merit (FoM) at the LOT level.
Sinyeong Kang +6 more
wiley +1 more source
Advanced Intelligent Systems, EarlyView.This study provides an introduction to Bayesian optimisation targeted for experimentalists. It explains core concepts, surrogate modelling, and acquisition strategies, and addresses common real‐world challenges such as noise, constraints, mixed variables, scalability, and automation.
Chuan He +2 more
wiley +1 more source