Defect-mediated generation-recombination dynamics governing conductance response in floating-body transistors. [PDF]
Kwak B +8 more
europepmc +1 more source
Power-Law Time Exponent <i>n</i> and Time-to-Failure in 4H-SiC MOSFETs: Beyond Fixed Reaction-Diffusion Theory. [PDF]
Dhyani M +3 more
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Temperature-Dependent Reverse-Recovery Behavior Analysis and Circuit-Level Mitigation of Superjunction MOSFETs. [PDF]
Cui W +6 more
europepmc +1 more source
Quantum transport insights into layer-dependent behavior of Sub-1 nm MoS<sub>2</sub> transistors for advanced scaling. [PDF]
Ghafoor M +6 more
europepmc +1 more source
Cryogenic neuromorphic circuits using gate-controlled negative differential resistance in silicon carbide. [PDF]
Yang X +10 more
europepmc +1 more source
Influence of Electrical Transients and A/D Converter Dynamics on Thermal Resistance Measurements of Power MOSFETs. [PDF]
Górecki K, Posobkiewicz K.
europepmc +1 more source
<i>Ab initio</i> quantum transport investigation of Sub-3 nm β-InSe transistors for future high-performance nanoelectronics. [PDF]
Ghafoor M +7 more
europepmc +1 more source
BV-<i>R<sub>on,sp</sub></i> Trade-Off Optimization in a Floating-P-Island-Assisted Silicon Shielded-Gate Trench MOSFET. [PDF]
Han Z +5 more
europepmc +1 more source
Research on the Short-Circuit Characteristics of Trench-Type SiC Power MOSFETs Under Single and Repetitive Pulse Strikes. [PDF]
Liu L, Pang B, Li S, Zhen Y, Li G.
europepmc +1 more source

