Results 151 to 160 of about 16,602 (212)

Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits. [PDF]

open access: yesMicromachines (Basel)
Malozyomov BV   +7 more
europepmc   +1 more source

Automated CHIP MTBF Calculator

2022 11th International Conference on Communications, Circuits and Systems (ICCCAS), 2022
exaly   +2 more sources

Evaluating MTBF Approximations for Simple Maintained Systems

IEEE Transactions on Reliability, 1986
This paper compares two approximations for evaluating the reliability of redundant systems subject to periodic maintenance (PM) wherein failed portions are periodically replaced. Such approximations are useful because exact analytic methods become burdensome even for seemingly simple redundant schemes.
Bhatt, Atul K., Haifley, Tim O.
openaire   +2 more sources

Failure Rate/MTBF

IEEE Transactions on Reliability, 1970
Failure rate is the most commonly used term in reliability and related engineering interests, yet it is still not well understood by perhaps the majority of those using it. Indeed, more than one reliability treatise wrongly defines failure rate as a conditional probability density, i.e., wrong by the accepted criterion of what constitutes any ...
openaire   +1 more source

MTBF Bounds for Multistage Synchronizers

2013 IEEE 19th International Symposium on Asynchronous Circuits and Systems, 2013
Synchronizers are used to mitigate the effects of metastability in multiple clock domain System-on-Chip devices. In order to enable reliable synchronization, the synchronizer MTBF (Mean Time Between Failures) should be much longer than the product lifetime. To achieve such high margins, multistage synchronizers are used. Several simulation methods have
Salomon Beer   +3 more
openaire   +1 more source

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