Results 161 to 170 of about 16,602 (212)

Product Level MTBF Calculation

2014 5th International Conference on Intelligent Systems, Modelling and Simulation, 2014
Synchronizers are used in sampling an asynchronous data for digital circuits. It protects the chips from metastability failure. As mean time between failure degrade with technology scaling while chip performance increase with multiple clock domain on chip and the synchronizer chain's usage increase, the mean time between failure, MTBF requirements is ...
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How to estimate and use MTTF/MTBF would the real MTBF please stand up?

2009 Annual Reliability and Maintainability Symposium, 2009
This paper discusses, with examples, uses of the terms Mean Time To Failure (MTTF) and Mean Time Between Failures (MTBF) in a variety of contexts. Especially, this paper points out how the same terms are explained and understood in a variety of meanings, and in very many cases are misinterpreted and misunderstood.
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Data classification and MTBF prediction with a multivariate analysis approach

Reliability Engineering and System Safety, 2012
Abstract The paper presents a multivariate statistical approach that supports the classification of mechanical components, subjected to specific operating conditions, in terms of the Mean Time Between Failure (MTBF). Assessing the influence of working conditions and/or environmental factors on the MTBF is a prerequisite for the development of an ...
Marco Frosolini
exaly   +3 more sources

A Simplified Flop MTBF Extraction Methodology

2022 5th International Conference on Circuits, Systems and Simulation (ICCSS), 2022
Ang Boon Chong, Aw Kean Hong
exaly   +2 more sources

Translating Mtbf into Dollars—A user's Perspective

Naval Engineers Journal, 1975
ABSTRACTReliability “trade‐offs” for a conceptual airborne tactical radar system are described in terms of MTBF versus Costs (materials, procurement, and life‐cycle), ambient temperature, and physical weight and size. This “trade‐off” methodology lends itself to computerized solution and was developed to allow definition of a system in a hardware sense.
M. W. WALCZAK, F. D. CALLISON, W. H. BAUR   +2 more
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MTBF of a complex binary coherent system

IEEE Transactions on Reliability, 1989
Summary: Prediction of the mean time between failures (MTBF) is an important aspect of the initial stages of system development. However, there has as yet been no detailed study of the relationships between the MTBF of a system and the sequences of component failures except for the case of a ``series'' system where every component failure causes a ...
exaly   +2 more sources

Calculating MTBF for modularized fault-trees

Annual Reliability and Maintainability Symposium 1993 Proceedings, 2002
It is shown that modularization is very helpful for determining system MTBF (mean time between failures) and/or related parameters such as mean system failure frequency and system MTTR (mean time to repair). An existence theorem for modules presented by R. Ashenhurst (1959) is brought to engineers' attention.
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Predicted vs Test MTBF's ... Why the Disparity?

Annual Reliability and Maintainability Symposium, 1984. Proceedings., 2005
Over the years there has been much concern and skepticism over the accuracy and usefulness of reliability predictions. This concern stems from the large variations often experienced between predicted and test observed Mean-Time-Between-Failure (MTBF's).
J.B. Lynch, L.J. Phaller
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A Monte Carlo simulation algorithm for finding MTBF

IEEE Transactions on Reliability, 1992
Prediction of mean time between failures (MTBF) is an important aspect of the initial stage of system development. It is often difficult to predict system MTBF during a given time since the component failure processes are extremely complex. The authors present a Monte Carlo simulation algorithm to calculate the MTBF during a given time of a binary ...
Kim C Kim, C, Lee, HK Lee, Hoe Kyung
exaly   +3 more sources

Reliability testing for non-constant MTBFs

IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology', 2003
The mean time between failures (MTBF) of new products has been found to increase with time due to the decreasing number of process problems and design problems found as test time is accumulated. The author's purpose is to show one method of considering this when developing a probability ratio sequential test plan (PRST). The method results in a shorter
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